Balakrishnan / Koutras / Milienos | Reliability Analysis and Plans for Successive Testing | E-Book | sack.de
E-Book

E-Book, Englisch, 266 Seiten

Balakrishnan / Koutras / Milienos Reliability Analysis and Plans for Successive Testing

Start-up Demonstration Tests and Applications

E-Book, Englisch, 266 Seiten

ISBN: 978-0-12-804362-2
Verlag: Elsevier Reference Monographs
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)



Reliability Analysis and Plans for Successive Testing: Start-up Demonstration Tests and Applications discusses all past and recent developments on start-up demonstration tests in the context of current numerical and illustrative examples to clarify available methods for distribution theorists and applied mathematicians dealing with control problems. Throughout the book, the authors focus on the panorama of open problems and issues of further interest. As contemporary manufacturers face tremendous commercial pressures to assemble works of high reliability, defined as 'the probability of the product performing its role under the stated conditions and over a specified period of time', this book helps address testing issues.Unites the tools and methodologies of applied statistics and stochastic modeling to aid the determination of device reliability for better performing consumer goodsClearly articulates how successive testing methods can be used in practiceComments not only on distribution sequences closed, but also on open problems and issues of further interest for researchers

Narayanaswamy Balakrishnan, Distinguished University Professor, is in the Department of Mathematics and Statistics McMaster University Hamilton, Ontario, Canada. Professor Balakrishnan is an internationally recognized expert on statistical distribution theory, and a book-powerhouse with 16 authored books, 4 authored handbooks, and 27 edited books under his name. He is currently the Editor-in-Chief of Communications in Statistics published by Taylor & Francis, and was also the Editor-in-Chief for the revised version of Encyclopedia of Statistical Sciences published by John Wiley & Sons. He is a Fellow of the American Statistical Association and a Fellow of the Institute of Mathematical Statistics, and in 2016 was awarded an Honorary Doctorate for The National and Kapodistrian University of Athens, Athens, Greece.
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