E-Book, Englisch, 344 Seiten, eBook
Reihe: NanoScience and Technology
Bhushan / Fuchs / Kawata Applied Scanning Probe Methods V
2007
ISBN: 978-3-540-37316-2
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark
Scanning Probe Microscopy Techniques
E-Book, Englisch, 344 Seiten, eBook
Reihe: NanoScience and Technology
ISBN: 978-3-540-37316-2
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark
The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the state-of-the-art of this technique. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Zielgruppe
Professional/practitioner
Autoren/Hrsg.
Weitere Infos & Material
Integrated Cantilevers and Atomic Force Microscopes.- Electrostatic Microscanner.- Low-Noise Methods for Optical Measurements of Cantilever Deflections.- Q-controlled Dynamic Force Microscopy in Air and Liquids.- High-Frequency Dynamic Force Microscopy.- Torsional Resonance Microscopy and Its Applications.- Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy.- Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale.- New AFM Developments to Study Elasticity and Adhesion at the Nanoscale.- Near-Field Raman Spectroscopy and Imaging.
