E-Book, Englisch, 427 Seiten, eBook
Reihe: NanoScience and Technology
Bhushan / Fuchs / Tomitori Applied Scanning Probe Methods X
2008
ISBN: 978-3-540-74085-8
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark
Biomimetics and Industrial Applications
E-Book, Englisch, 427 Seiten, eBook
Reihe: NanoScience and Technology
ISBN: 978-3-540-74085-8
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
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Weitere Infos & Material
Bharat Bhushan and Robert A. Sayer: Gecko Feet: Natural Attachment Systems for Smart Adhesion-Mechanism, Modeling and Development of Bio-Inspired Materials.- Filippo Giannazzo, Patrick Fiorenza, Vito Raineri: Carrier transport in advanced semiconductor materials.- Yasuo Cho: Visualization of fixed charges stored in condensed matter and its application to memory technology.- Toshi Kasai, Haresh Siriwardane and Bharat Bhushan: Applications of SPM in Chemical Mechanical Planarization (CMP).- Ken-ichi Shinohara: Scanning probe microscope application for single molecules in a p-conjugated polymer toward the molecular devices based on polymer chemistry.- Joachim Loos and Alexander Alexeev: Scanning Probe Microscopy on Polymer Solar Cells.- Hiroyuki Sugimura: Scanning probe anodization for nanopatterning.- Mario D'Acunto, Franco Maria Montevecchi, Paolo Giusti and Gianluca Ciardelli: Tissue Engineering: Nanoscale Contacts in Cell Adhesion to Substrates.- Tatsuo Ushiki and Kazushige Kawabata: Scanning probe microscopy in biological research.- Jiping Ye: Novel nanoindentation techniques and their applications.- Yasushi Kadota: Application to nano-dispersion macromolecule material evaluation in an electrophotographic printer.-
Tianming Bao, David Fong, and Sean Hand: Automated AFM as Industrial Process Metrology for Nanoelectronic Manufacturing
