Failure Analysis

High Technology Devices
1. Auflage 2022
ISBN: 978-1-5015-2478-3
Verlag: De Gruyter

Buch, Englisch, 120 Seiten, Format (B × H): 170 mm x 240 mm, Gewicht: 262 g

Reihe: De Gruyter STEM

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

Zielgruppe

Engineers and graduate students in materials science and high tec

Autoren/Hrsg.

Carleton, Eric J.

Sullivan, Daniel J. D.

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Elektronik, Optik
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffprüfung
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Produktionstechnik Zuverlässigkeitstechnik
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Elektronische Baugruppen, Elektronische Materialien

Über Autor(innen)

Dr. Daniel J. D. Sullivan

attended Cal & U. C. San Diego. Managed: FA, Reliability and Materials labs. Currently in sales and marketing at EAG labs. He has also written a non-technical book, “Don’t Date Crazy” by DJDS, and published a board game called Infection.

Dr. Eric J. Carleton

is a technology developer and consultant who has incubated multiple technology startups, founded Arrhenius, a failure analysis firm, and serves clients in a wide array of industries on scientific analysis and litigation matters.