Buch, Englisch, 269 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 435 g
Buch, Englisch, 269 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 435 g
ISBN: 978-3-642-05895-0
Verlag: Springer
At the turn of the 19 century, Carl Friedrich Gauß founded error calculus by predicting the then unknown position of the planet Ceres. Ever since, error calculus has occupied a place at the heart of science. In this book, Grabe illustrates the breakdown of traditional error calculus in the face of modern measurement techniques. Revising Gauß’ error calculus ab initio, he treats random and unknown systematic errors on an equal footing from the outset. Furthermore, Grabe also proposes what may be called well defined measuring conditions, a prerequisite for defining confidence intervals that are consistent with basic statistical concepts. The resulting measurement uncertainties are as robust and reliable as required by modern-day science, engineering and technology.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Naturwissenschaften Physik Physik Allgemein Theoretische Physik, Mathematische Physik, Computerphysik
- Mathematik | Informatik Mathematik Stochastik Mathematische Statistik
- Mathematik | Informatik Mathematik Numerik und Wissenschaftliches Rechnen Angewandte Mathematik, Mathematische Modelle
- Naturwissenschaften Physik Angewandte Physik
- Technische Wissenschaften Technik Allgemein Mess- und Automatisierungstechnik
- Technische Wissenschaften Technik Allgemein Mathematik für Ingenieure
Weitere Infos & Material
Characterization, Combination and Propagation of Errors.- Basic Ideas of Measurement.- Formalization of Measuring Processes.- Densities of Normal Parent Distributions.- Estimators and Their Expectations.- Combination of Measurement Errors.- Propagation of Measurement Errors.- Least Squares Adjustment.- Least Squares Formalism.- Consequences of Systematic Errors.- Uncertainties of Least Squares Estimators.- Special Linear and Linearized Systems.- Systems with Two Parameters.- Systems with Three Parameters.- Special Metrology Systems.
