Henzler Time-to-Digital Converters

1. Auflage 2010
ISBN: 978-90-481-8628-0
Verlag: Springer Netherlands
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, Band 29, 124 Seiten

Reihe: Springer Series in Advanced Microelectronics

Micro-electronics and so integrated circuit design are heavily driven by technology scaling. The main engine of scaling is an increased system performance at reduced manufacturing cost (per system). In most systems digital circuits dominate with respect to die area and functional complexity. Digital building blocks take full - vantage of reduced device geometries in terms of area, power per functionality, and switching speed. On the other hand, analog circuits rely not on the fast transition speed between a few discrete states but fairly on the actual shape of the trans- tor characteristic. Technology scaling continuously degrades these characteristics with respect to analog performance parameters like output resistance or intrinsic gain. Below the 100 nm technology node the design of analog and mixed-signal circuits becomes perceptibly more dif cult. This is particularly true for low supply voltages near to 1V or below. The result is not only an increased design effort but also a growing power consumption. The area shrinks considerably less than p- dicted by the digital scaling factor. Obviously, both effects are contradictory to the original goal of scaling. However, digital circuits become faster, smaller, and less power hungry. The fast switching transitions reduce the susceptibility to noise, e. g. icker noise in the transistors. There are also a few drawbacks like the generation of power supply noise or the lack of power supply rejection.

Autoren/Hrsg.

Henzler, Stephan

Inhaltsverzeichnis

1;Contents;7
2;List of Symbols and Abbreviations;9
3;1 Foreword;12
4;2 Time-to-Digital Converter Basics;15
4.1;2.1 Motivation -- The Way to the Time Domain;15
4.2;2.2 Analog Time-to-Digital Converters -- The First Generation;18
4.3;2.3 Fully Digital TDCs -- The Second Generation;22
4.4;2.4 Basic Digital Delay-Line Based TDC;23
4.4.1;2.4.1 Inverter Based Time-to-Digital Converter;25
4.5;2.5 Synchronous Versus Asynchronous Time Interval Measurement;28
5;3 Theory of TDC Operation;29
5.1;3.1 Basic Performance Figures;29
5.2;3.2 Quantization Error Revisited;31
5.2.1;3.2.1 Linear Imperfections of TDC Characteristic;32
5.3;3.3 Non-Linear Imperfections of TDC Characteristic;34
5.4;3.4 Dynamic Performance and Effective Resolution;35
5.4.1;3.4.1 Basic ENOB Definition;37
5.5;3.5 Timing Figures;41
5.6;3.6 Noise Shaping in Time-to-Digital Converters;41
5.7;3.7 Process Variations in TDCs;44
5.7.1;3.7.1 Impact of Local Variations in Buffer Tree;46
5.7.2;3.7.2 Impact of Local Process Variations on Delay-Line;47
5.7.3;3.7.3 Impact of Local Process Variations on the Comparators;49
5.7.4;3.7.4 Combined Impact of Local Variations on TDCs;50
6;4 Advanced TDC Design Issues;53
6.1;4.1 Bipolar Time-to-Digital Converter;53
6.2;4.2 Looped Time-to-Digital Converter;55
6.3;4.3 Linearly Extended TDC Loop;59
6.3.1;4.3.1 Operation and Calibration of Linearly Extended TDC;60
6.4;4.4 Delay-Locked-Loop Based TDC;63
6.5;4.5 Hierarchical Time-to-Digital Converter;65
6.6;4.6 Multi-Event Time-to-Digital Converter;69
6.7;4.7 On-Chip Test and Characterization Engine;73
6.8;4.8 Time Domain Quantizer;75
6.9;4.9 Summary TDC Architectures;77
7;5 Time-to-Digital Converters with Sub-GatedelayResolution -- The Third Generation;79
7.1;5.1 Sub-Gate Delay Resolution;79
7.2;5.2 Parallel Scaled Delay Elements;80
7.2.1;5.2.1 Variability in TDC Based on Parallel ScaledDelay Elements;82
7.3;5.3 Vernier TDC;84
7.3.1;5.3.1 Vernier TDC in Loop Configuration;86
7.3.2;5.3.2 Variability in Vernier TDC;88
7.4;5.4 Pulse-Shrinking TDC;90
7.4.1;5.4.1 Pulse-Shrinking TDC in Loop Configuration;93
7.4.2;5.4.2 Variability in Pulse-Shrinking TDC;94
7.5;5.5 Local Passive Interpolation TDC;96
7.5.1;5.5.1 LPI-TDC in Loop Configuration;99
7.5.2;5.5.2 Resistor Sizing and Interpolation Accuracy;99
7.5.3;5.5.3 Variability in LPI-TDC;102
7.5.4;5.5.4 Implementation Example;104
7.6;5.6 Gated Ring Oscillator TDC;106
7.7;5.7 Time-to-Digital Converter with Time Amplification;108
8;6 Applications for Time-to-Digital Converters;113
8.1;6.1 Digital Phase Locked Loop;113
8.2;6.2 TDC Based Analog-to-Digital Converter;117
8.2.1;6.2.1 Dual-Slope Analog-to-Digital Converter Revisited;117
8.2.2;6.2.2 Pulse Position Modulation Analog-to-Digital Converter;119
8.2.3;6.2.3 Sigma Delta Modulator with Time Domain Quantizer;121
9;References;124
10;Index;128