Michael / Ismail | Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits | E-Book | www.sack.de
E-Book

E-Book, Englisch, Band 211, 190 Seiten, eBook

Reihe: The Springer International Series in Engineering and Computer Science

Michael / Ismail Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits


1993
ISBN: 978-1-4615-3150-0
Verlag: Springer US
Format: PDF
 Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, Band 211, 190 Seiten, eBook

Reihe: The Springer International Series in Engineering and Computer Science

ISBN: 978-1-4615-3150-0
Verlag: Springer US
Format: PDF
 Kopierschutz: 1 - PDF Watermark

As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. describes a statistical circuit simulation and optimization environment for VLSI circuit designers. The first step toward accomplishing statistical circuit design and optimization is the development of an accurate CAD tool capable of performing statistical simulation. This tool must be based on a statistical model which comprehends the effect of device and circuit characteristics, such as device size, bias, and circuit layout, which are under the control of the circuit designer on the variability of circuit performance. The distinctive feature of the CAD tool described in this book is its ability to accurately model and simulate the effect in both intra- and inter-die process variability on analog/digital circuits, accounting for the effects of the aforementioned device and circuit characteristics. serves as an excellent reference for those working in the field, and may be used as the text for an advanced course on the subject.
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Zielgruppe

Research

Autoren/Hrsg.

Michael, Christopher
Ismail, Mohammed

Weitere Infos & Material

List of Figures. List of Tables. Preface. 1. Introduction. 2. Survey of Statistical Modeling and Simulation Techniques. 3. Statistical MOS Model. 4. Experimental Process Characterization for MOS Statistical Model. 5. CAD Implementation of the SMOS Model. 6. Statistical CAD of Analog MOS Circuits. 7. Applications of the SMOS Model to Digital Integrated Circuits. 8. Conclusion and Future Work. Appendix A: MCP-SPICE Implementation of SMOS. Appendix B: APLAC Input Files. Bibliography. Index.

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