E-Book, Englisch, Band 19, 320 Seiten, eBook
Stroud A Designer’s Guide to Built-In Self-Test
2002
ISBN: 978-0-306-47504-7
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark
E-Book, Englisch, Band 19, 320 Seiten, eBook
Reihe: Frontiers in Electronic Testing
ISBN: 978-0-306-47504-7
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
Preface. About the Author. 1. An Overview of BIST. 2. Fault Models, Detection, and Simulation. 3. Design for Testability. 4. Test Pattern Generation. 5. Output Response Analysis. 6. Manufacturing and System-Level Use of BIST. 7. Built-In Logic Block Observer. 8. Pseudo-Exhaustive BIST. 9. Circular BIST. 10. Scan-Based BIST. 11. Non-Intrusive BIST. 12. BIST for Regular Structures. 13. BIST for FPGAs and CPLDs. 14. Applying Digital BIST of Mixed-Signal Systems. 15. Merging BIST and Concurrent Fault Detection. Acronyms. Bibliography. Index.
