Buch, Englisch, 125 Seiten, Paperback, Format (B × H): 155 mm x 235 mm, Gewicht: 2488 g
Buch, Englisch, 125 Seiten, Paperback, Format (B × H): 155 mm x 235 mm, Gewicht: 2488 g
Reihe: SpringerBriefs in Applied Sciences and Technology
ISBN: 978-4-431-54447-0
Verlag: Springer Japan
The typical users of the TEM are top-level researchers working at the frontiers of new materials or with new biological specimens. They often use the TEM under extremely severe conditions, with problems sometimes occurring in the vacuum system of the microscopes. JEOL engineers then must work as quickly as possible to improve the vacuum evacuation system so as to prevent the recurrence of such problems. Among the wealth of explanatory material in this book are examples of users’ reports of problems in the vacuum system of the JEM, such as the occurrence of a micro-discharge and the back-streaming of the diffusion pump (DP) oil vapor.
This work is a valuable resource for researchers who use the transmission electron microscope and for engineers and scientists interested in its technology.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
Introduction of the electron microscope.- History of JEOL electron microscopes.- Accidents and information, instructing us to improve the vacuum systems of JEMs.- Development of the evacuation systems for JEMs.- Development of JEOL SIPs.- Ultrahigh vacuum electron microscopes.