Buch, Englisch, 367 Seiten, Paperback, Format (B × H): 155 mm x 235 mm, Gewicht: 587 g
Buch, Englisch, 367 Seiten, Paperback, Format (B × H): 155 mm x 235 mm, Gewicht: 587 g
ISBN: 978-1-4471-6029-8
Verlag: Springer
Information Modeling for Interoperable Dimensional Metrology analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. It discusses new approaches and data models for solving interoperability problems, as well as introducing process activities, existing and emerging data models, and the key technologies of dimensional metrology systems.
Written for researchers in industry and academia, as well as advanced undergraduate and postgraduate students, this book gives both an overview and an in-depth understanding of complete dimensional metrology systems. By covering in detail the theory and main content, techniques, and methods used in dimensional metrology systems, Information Modeling for Interoperable Dimensional Metrology enables readers to solve real-world dimensional measurement problems in modern dimensional metrology practices.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
1. Introduction.- 2. Practices of Information Modeling.- 3. Product Definition and Dimensional Metrology Systems.- 4. High-Level Dimensional Metrology Process Planning.- 5. Low-Level Dimensional Metrology Process Planning and Execution.- 6. Quality Data Analysis and Reporting.- 7. Dimensional Metrology Interoperability Issues.- 8. Dimensional Metrology for Manufacturing Quality Control.- 9. Outlook for the Future of Dimensional Metrology Systems Interoperability.