Buch, Englisch, 222 Seiten, Format (B × H): 155 mm x 231 mm, Gewicht: 540 g
Buch, Englisch, 222 Seiten, Format (B × H): 155 mm x 231 mm, Gewicht: 540 g
ISBN: 978-1-78548-149-9
Verlag: ISTE PR ELSEVIER
Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications.
Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED devices. The authors review GaN-based LED technology by focusing on the main failure mechanisms targeting polymer-based packaging, thanks to electrical and spectral models.
The proposed technology and methodologies will help those interested in the topic to further their knowledge of failure mechanisms, exploring the physical and chemical analyses involved.
Zielgruppe
End users of solid-state lighting, manufacturer of LEDs modules and component assembly, students and professor in the physics of semiconductor and lighting technologies
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
1. Light-emitting Diodes: State-of-the-Art GaN Technologies 2. Tools and Analysis Methods of Encapsulated LEDs 3. Failure Analysis Methodology of Blue LEDs 4. Integration of the Methodology Starting from Component Design