Buch, Englisch, 362 Seiten, Book w. online files / update, Format (B × H): 155 mm x 235 mm, Gewicht: 598 g
Modern Techniques
Buch, Englisch, 362 Seiten, Book w. online files / update, Format (B × H): 155 mm x 235 mm, Gewicht: 598 g
ISBN: 978-1-84628-023-8
Verlag: Springer
Taking a three-pronged approach – test engineering from traditional-test, design and manufacturing view-points – Integrated Circuit Test Engineering encapsulates the subject as it stands today. After introductory background from basic testing rules to trends in technology, the reader learns about: fabrication processes; a complete range of detailed tests and procedures; how to design for testability; fault simulation; automatic test equipment and the economics of testing.
The text incudes:
• Worked examples and exercises, well-organized references and bibliography.
• An introduction to the use of various software and languages such as MATLAB®, Spice, Verilog®-HDL and VHDL.
• A series of experiments based on material downloaded from springeronline.com showing how to construct a hardware test arrangement for MS Windows PCs.
This book is a practical tool for advanced undergraduate and graduate electronic engineering students, a resource for their tutors and a guide for the practising electronic engineer.
Zielgruppe
Graduate
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
to Integrated Circuit Test Engineering.- Fabrication Processes for Integrated Circuits.- Digital Logic Test.- Memory Test.- Analogue Test.- Mixed-Signal Test.- Input-Output Test.- Design for Testability — Structured Test Approaches.- System on a Chip (SoC) Test.- Test Pattern Generation and Fault Simulation.- Automatic Test Equipment (ATE) and Production Test.- Test Economics.




