E-Book, Englisch, Band 58, 180 Seiten, eBook
Huang Robust Computing with Nano-scale Devices
1. Auflage 2010
ISBN: 978-90-481-8540-5
Verlag: Springer Netherland
Format: PDF
Kopierschutz: 1 - PDF Watermark
Progresses and Challenges
E-Book, Englisch, Band 58, 180 Seiten, eBook
Reihe: Lecture Notes in Electrical Engineering
ISBN: 978-90-481-8540-5
Verlag: Springer Netherland
Format: PDF
Kopierschutz: 1 - PDF Watermark
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
Fault Tolerant Nanocomputing.- Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics.- Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays.- Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics.- The Prospect and Challenges of CNFET Based Circuits: A Physical Insight.- Computing with Nanowires: A Self Assembled Neuromorphic Architecture.- Computational Opportunities and CAD for Nanotechnologies.