Buch, Englisch, 148 Seiten, Format (B × H): 161 mm x 240 mm, Gewicht: 396 g
The Technology Satisfaction Model
Buch, Englisch, 148 Seiten, Format (B × H): 161 mm x 240 mm, Gewicht: 396 g
ISBN: 978-1-032-47140-2
Verlag: Chapman and Hall/CRC
This book introduces the fundamentals of the technology satisfaction model (TSM), supporting readers in applying the Rasch model and structural equation modeling (SEM) – a multivariate technique – to higher education (HE) research. User satisfaction is traditionally measured along a single dimension. However, the TSM includes digital technologies for teaching, learning and research across three dimensions: computer efficacy, perceived ease of use and perceived usefulness. Establishing relationships among these factors is a challenge. Although commonly used in psychology to trace relationships, Rasch and SEM approaches are rarely used in educational technology or library and information science. This book, therefore, shows that combining these two analytical tools offers researchers better options for measurement and generalisation in HE research. This title presents theoretical and methodological insights of use to researchers in HE.
Zielgruppe
General and Postgraduate
Autoren/Hrsg.
Fachgebiete
- Sozialwissenschaften Pädagogik Schulen, Schulleitung Universitäten, Hochschulen
- Sozialwissenschaften Psychologie Psychologie / Allgemeines & Theorie Psychologische Forschungsmethoden
- Sozialwissenschaften Psychologie Psychologie / Allgemeines & Theorie Psychologie: Allgemeines
- Mathematik | Informatik Mathematik Stochastik
- Sozialwissenschaften Pädagogik Pädagogik Bildungswesen: Organisation und Verwaltung
Weitere Infos & Material
1. Assessment of ICT in Higher Education Applying the TSM. 2. Testing Online Learning Satisfaction in Higher Education. 3. Assessing Online Research Databases in Higher Education Using the TSM. 4. Measurement of Wireless Internet in Higher Education Using the TSM.




