Surface Science Tools for Nanomaterials Characterization

2015
ISBN: 978-3-662-44550-1
Verlag: Springer

Buch, Englisch, 652 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 1150 g

Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

Zielgruppe

Research

Autoren/Hrsg.

Kumar, Challa S. S. R.

Fachgebiete

• Naturwissenschaften Chemie Physikalische Chemie Molekulare Chemische Nanostrukturen
• Naturwissenschaften Chemie Physikalische Chemie Oberflächenchemie und Adsorption
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
• Naturwissenschaften Physik Thermodynamik Oberflächen- und Grenzflächenphysik, Dünne Schichten
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Biomaterialien, Nanomaterialien, Kohlenstoff

Inhaltsverzeichnis

Higher Resolution Scanning Probe Methods for Magnetic Imaging.- The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials.- SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography.- Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy.- Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM).- Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy.- Magnetic Force Microscopy.- High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films.- FIM-Characterized Tips for SPM.- Scanning Conductive Torsion Mode Microscopy.- Scanning Probe Acceleration Microscopy (SPAM).- Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures.- Field Ion Microscopy (FIM).- Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.

Über Autor(innen)

Dr. Challa S. S. R. Kumar is Director of Nanofabrication and Nanomaterials at the Center for Advanced Microstructures and Devices at Louisiana State University in Baton Rouge, USA. He is also President and CEO of Magnano Technologies and has some years of industrial R&D experience working for Imperial Chemical Industries and United Breweries. His main research interests are the development of novel synthetic methods, including those based on microfluidic reactors, for the synthesis of multifunctional nanomaterials. Dr. Kumar is the winner of the 2006 Nano 50 Technology Award for his work in magnetic-based nanoparticles for cancer imaging and treatment. He is the editor and author of several books and journal articles and a former editor of the Journal of Biomedical Nanotechnology.