Statistical Methods for Reliability Data

1. Auflage 1998
ISBN: 978-0-471-14328-4
Verlag: Wiley

Buch, Englisch, 712 Seiten, Format (B × H): 172 mm x 241 mm, Gewicht: 1204 g

Reihe: Wiley Series in Probability and Statistics

In den letzten 10 Jahren stand die Verbesserung von Qualität, Produktivität und Zuverlässigkeit von Erzeugnissen im Mittelpunkt des Interesses, wobei statistische Techniken experimenteller Design- und statistischer Verfahrenskontrolle eine Hauptrolle spielten. In Zukunft wird dem Aspekt Zuverlässigkeit verstärkte Bedeutung zukommen. Ziel dieses Buches ist es, moderne Analysemethoden zur Messung von Zuverlässigkeitsdaten und Studien über Planungsgenauigkeit als Lehrstoff aufzubereiten - mit vielen Übungsaufgaben zu Analyse und Interpretation. (8/98)

Autoren/Hrsg.

Meeker, William Q.

Escobar, Luis A.

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Produktionstechnik Industrielle Qualitätskontrolle
• Technische Wissenschaften Energietechnik | Elektrotechnik Elektrotechnik
• Technische Wissenschaften Verfahrenstechnik | Chemieingenieurwesen | Biotechnologie Verfahrenstechnik, Chemieingenieurwesen
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Produktionstechnik Zuverlässigkeitstechnik

Inhaltsverzeichnis

Partial table of contents:

Reliability Concepts and Reliability Data.

Nonparametric Estimation.

Other Parametric Distributions.

Probability Plotting.

Bootstrap Confidence Intervals.

Planning Life Tests.

Degradation Data, Models, and Data Analysis.

Introduction to the Use of Bayesian Methods for Reliability Data.

Failure-Time Regression Analysis.

Accelerated Test Models.

Accelerated Life Tests.

Case Studies and Further Applications.

Epilogue.

Appendices.

References.

Indexes.

Über Autor(innen)

WILLIAM Q. MEEKER, PhD, is Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University. He is a Fellow of the American Statistical Association and an elected member of the International Statistics Institute. Among his many awards and honors are the Youdan Prize and two Wilcoxon Prizes as well as two awards for outstanding teaching at Iowa State. He is coauthor of Statistical Intervals: A Guide for Practitioners (Wiley) and of numerous book chapters and publications in the engineering and statistical literature. A former editor of Technometrics and coeditor of Selected Tables in Mathematical Statistics, he is currently Associate Editor for International Statistical Review. LUIS A. ESCOBAR, PhD, is a Professor in the Department of Experimental Statistics at Louisiana State University. His research and consulting interests include statistical analysis of reliability data, accelerated testing, survival analysis, and nonlinear models. An Associate Editor for Technometrics and the IIE Transactions of Quality and Reliability Engineering, Professor Escobar is a Fellow of the American Statistical Association and elected member of the International Statistics Institute. He is the author of several book chapters, and his publications have appeared in the engineering and statistical literature.