Handbook of Charged Particle Optics

2. New Auflage 2008
ISBN: 978-1-4200-4554-3
Verlag: Taylor & Francis Inc

Buch, Englisch, 686 Seiten, Format (B × H): 187 mm x 263 mm, Gewicht: 1393 g

With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments.

The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work.

Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.

Zielgruppe

Professional

Autoren/Hrsg.

Orloff, Jon

Fachgebiete

• Technische Wissenschaften Verfahrenstechnik | Chemieingenieurwesen | Biotechnologie Fertigungsverfahren der Präzisionsgeräte

Inhaltsverzeichnis

Computational Techniques for Design of Charged Particle Optical Systems. A Review of the Zr/O Schottky Cathode. Liquid Metal Ion Sources. Magnetic Lenses for Electron Microscopy. Electrostatic Lenses. Aberrations. Aberration Correction. Space Charge and Statistical Effects. Resolution. The Scanning Electron Microscope. The Scanning Transmission Electron Microscope. The Transmission Electron Microscope. Focused on Ion Beams. Applications of Gas Phase Field Ionization Sources.

Über Autor(innen)

Jon Orloff