Structural, Syntactic, and Statistical Pattern Recognition

Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings
1. Auflage 2016
ISBN: 978-3-319-49054-0
Verlag: Springer International Publishing

Buch, Englisch, Band 10029, 588 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 9007 g

Reihe: Lecture Notes in Computer Science

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis. 

Zielgruppe

Research

Autoren/Hrsg.

Robles-Kelly, Antonio

Loog, Marco

Wilson, Richard

Biggio, Battista

Escolano, Francisco

Fachgebiete

• Mathematik | Informatik EDV | Informatik Informatik Künstliche Intelligenz Mustererkennung, Biometrik
• Mathematik | Informatik EDV | Informatik Informatik Theoretische Informatik
• Mathematik | Informatik EDV | Informatik Angewandte Informatik
• Mathematik | Informatik EDV | Informatik Daten / Datenbanken Data Mining

Inhaltsverzeichnis

Dimensionality reduction.- Manifold learning and embedding methods.-Dissimilarity representations.- Graph-theoretic methods.- Model selection, classification and clustering.- Semi and fully supervised learning methods.- Shape analysis.- Spatio-temporal pattern recognition.- Structural matching.- Text and document analysis.