Diffuse X-Ray Scattering and Models of Disorder

2. Auflage 2022
ISBN: 978-0-19-886248-2
Verlag: Sinauer Associates Is an Imprint of Oxford University Press

Buch, Englisch, Band 31, 424 Seiten, Format (B × H): 164 mm x 239 mm, Gewicht: 912 g

Reihe: International Union of Crystallography Monographs on Crystallography

Diffuse X-ray scattering is a rich source of local structural information over and above that obtained by conventional crystal structure determination. The main aim of the book is to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analysed.

Since the first edition was published in 2004 there have been major improvements both in the experimental methods for recording diffuse scattering and in our ability to analyse it. The advent of new and better detectors means that fully 3-dimensional diffuse scattering data can be collected routinely for even quite small samples and computational power that is now available has continued its upward trend, meaning modelling calculations inconceivable in 2004 are now routine. The final part of the book traces these recent developments and outlines their future potential in the field.

Autoren/Hrsg.

Welberry, T R

Fachgebiete

• Naturwissenschaften Chemie Physikalische Chemie Chemische Kristallographie
• Naturwissenschaften Physik Thermodynamik Festkörperphysik, Kondensierte Materie

Über Autor(innen)

Following his PhD degree (1968-1970) in Kathleen Lonsdale's Chemical Crystallography Laboratory at University College, London and a Postdoctoral Fellowship at University College Cardiff, T. R. Welberry was appointed to the Research School of Chemistry at ANU in 1975 and subsequently became full Professor and is now an Emeritus Professor. He was Co-editor of two IUCr Journals over a period of 15 years and is now Editor of International Tables for Crystallography Vol. C.