E-Book, Englisch, 89 Seiten, eBook
Reihe: SpringerBriefs in Electrical and Computer Engineering
Bou-Sleiman / Ismail Built-in-Self-Test and Digital Self-Calibration for RF SoCs
1. Auflage 2011
ISBN: 978-1-4419-9548-3
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark
E-Book, Englisch, 89 Seiten, eBook
Reihe: SpringerBriefs in Electrical and Computer Engineering
ISBN: 978-1-4419-9548-3
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
Introduction and Motivation.- Radio Systems Overview: Architecture, Performance and Built-in-Test.- Efficient Testing for RF SoCs.- RF Built-in-Self-Test.- RF Built-in-Self-Calibration.- Conclusions.
