Cohen / Lightbody Atomic Force Microscopy/Scanning Tunneling Microscopy 3

1. Auflage 2007
ISBN: 978-0-306-47095-0
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 218 Seiten

The editors have done a fine job assembling a variety of contributions of varied style, topics, and current relevance into a coherent whole. The quality of the images, typesetting are all excellent and the book is organized in a thoughtful way.

Autoren/Hrsg.

Cohen, Samuel H.

Lightbody, Marcia L.

Inhaltsverzeichnis

1;PREFACE;5
2;CONTENTS;7
3;A PRACTICAL APPROACH TO UNDERSTANDING SURFACE METROLOGY AND ITS APPLICATIONS;9
3.1;INTRODUCTION;9
3.2;SCALES OF INTERACTION – GENERAL AND FUNDAMENTAL;10
3.3;SCALES OF INTERACTION IN MEASUREMENT;11
3.4;SCALES OF INTERACTION IN CONVENTIONAL ANALYSIS;12
3.5;SCALE- SENSITIVE GEOMETRIC PROPERTIES AND FRACTAL ANALYSIS;14
3.6;THE SELECTION OF ANALYSISMETHODS AND CHARACTERIZATION PARAMETERS;15
3.7;INFORMATION CONTENT;16
3.8;CONCLUDING REMARKS;17
3.9;Acknowledgments;17
3.10;REFERENCES;17
4;APPLICATIONS OF SCANNING PROBE MICROSCOPY IN MATERIALS SCIENCE: EXAMPLES OF SURFACE MODIFICATION AND QUANTITATIVE ANALYSIS;19
4.1;INTRODUCTION;19
4.2;MATERIALS AND METHODS;20
4.3;EXAMPLES OF MODIFICATION AND STRUCTURING OF SUFACES;20
4.4;EXAMPLES OF QUANTITATIVE ANALYSES OF SURFACE TOPOGRAPHY;22
4.5;DISCUSSION: PROBLEMS AND PERSPECTIVES;35
4.6;Acknowledgments;35
4.7;REFERENCES;36
5;SCANNING PROBE MICROSCOPY IN BIOLOGY WITH POTENTIAL APPLICATIONS IN FORENSICS;38
5.1;INTRODUCTION;38
5.2;PROBES;39
5.3;ARTIFACTS AND RESOLUTION;40
5.4;Other Nucleo-Protein Systems;45
5.5;SUMMARY;53
5.6;Acknowledgments;53
5.7;REFERENCES;54
6;ATOMIC MANIPULATION OF HYDROGEN ON HYDROGEN-TERMINATED SILICON SURFACES WITH SCANNING TUNNELING MICROSCOPE;56
6.1;INTRODUCTION;56
6.2;MATERIALS AND METHODS;57
6.3;Si( 100)- 2 x 1 Surface Preparation;57
6.4;Hydrogen- Terminated Silicon Surfaces;58
6.5;RESULTS AND DISCUSSIONS Hydrogen Extraction from the Si( 100)- 2 x 1: H Surface;60
6.6;Hydrogen Deposition onto the Si( 100)- 2 x 1: H Surface;65
6.7;CONCLUSIONS;68
6.8;ACKNOWLEDGMENTS;69
6.9;REFERENCES;70
7;APOLLO 11 LUNAR SAMPLES: AN EXAMINATION USING TAPPING MODE ATOMIC FORCE MICROSCOPY AND OTHER MICROSCOPIC METHODS;72
7.1;INTRODUCTION;72
7.2;MATERIALS AND METHODS;73
7.3;RESULTS AND DISCUSSION;74
7.4;CONCLUSION;76
7.5;REFERENCE;80
8;NOVEL MICROMACHINED CANTILEVER SENSORS FOR SCANNING NEAR-FIELD MICROSCOPY;81
8.1;INTRODUCTION;81
8.2;NEAR-FIELD SENSOR TECHNOLOGY;82
8.3;EXPERIMENTAL SET-UP;83
8.4;RESULTS;85
8.5;CONCLUSION;87
8.6;Acknowledgment;87
8.7;REFERENCES;87
9;IMAGING OF CELL SURFACE STRUCTURE BY SCANNING PROBE MICROSCOPY;88
9.1;INTRODUCTION AND EXPERIMENTAL;88
9.2;RESULTS AND DISCUSSION;89
9.3;CONCLUSION;91
9.4;REFERENCES;91
10;A FORCE LIMITATION FOR SUCCESSFUL OBSERVATION OF ATOMIC DEFECTS: DEFECT TRAPPING OF THE ATOMIC FORCE MICROSCOPY TIP;92
10.1;INTRODUCTION;92
10.2;Model for the Simulations;93
10.3;RESULTS AND DISCUSSION;95
10.4;CONCLUSIONS;99
10.5;REFERENCES;99
11;A NEW APPROACH TO EXAMINE INTERFACIAL INTERACTION POTENTIAL BETWEEN A THIN SOLID FILM OR A DROPLET AND A SMOOTH SUBSTRATE;101
11.1;INTRODUCTION;101
11.2;EXPERIMENTAL;102
11.3;RESULTS AND DISCUSSION;103
11.4;I. Sublimation Rate ofMicron-Sized TNT on Silica Surface Ia. Tapping Mode AFM Study of a Thin Solid TNT Film on a Silica Surface;104
11.5;Ib. Model Consideration;106
11.6;11. Evaporation of TNT Liquid Droplets on Silica Surface;110
11.7;IIa. AFM Images Of Explosive Droplets On Silica Surfaces;111
11.8;IIb. A Model Consideration;113
11.9;CONCLUSION;115
11.10;ACKNOWLEDGMENTS;115
11.11;REFERENCES;115
12;NANOMETER-SCALE PATTERNING OF SURFACES USING SELF-ASSEMBLY CHEMISTRY. 1. PRELIMINARY STUDIES OF POLYANILINE ELECTRODEPOSITION ON SELF-ASSEMBLED MIXED MONOLAYERS;116
12.1;INTRODUCTION;116
12.2;EXPERIMENTAL;117
12.3;RESULTS AND DISCUSSION;118
12.4;CONCLUSION;122
12.5;Acknowledgment;122
12.6;REFERENCES;122
13;LOCAL RATE OF ELECTROLESS COPPER DEPOSITION BY SCANNING TUNNELING MICROSCOPY;124
13.1;INTRODUCTION;124
13.2;EXPERIMENTAL;125
13.3;RESULTS;126
13.4;Acknowledgments;126
13.5;REFERENCES;126
14;ATOMIC FORCE MICROSCOPY OF OLIVINE;127
14.1;INTRODUCTION;127
14.2;MATERIALS AND METHODS;128
14.3;RESULTS AND DISCUSSION;129
14.4;SUMMARY;134
14.5;Acknowledgments;136
14.6;REFERENCES;136
15;THE STUDY OF SUBLIMATION RATES AND NUCLEATION AND GROWTH OF TNT AND PETN ON SILICA AND GRAPHITE SURFACES BY OPTICAL AND ATOMIC FORCE MICROSCOPY AND ELLIPSOMETRY;137
15.1;INTRODUCTION;138
15.2;EXPERIMENTAL;139
15.3;Optical and Atomic Force Microscopy and Ellipsometry;140
15.4;RESULTS AND DISCUSSION;140
15.5;Characterization of Deposited TNT and PETN on Silica Surfaces;140
15.6;SUBLIMATION RATES OF TNT FROM SILICA, MICA, AND GRAPHITE SURFACES;148
15.7;Comparison of TNT Sublimation Rates on Three Different Surfaces;151
15.8;Effective Sublimation Rate Measured By Ellipsometry;151
15.9;CONCLUSION;152
15.10;Acknowledgment;153
15.11;REFERENCES;154
16;PECULIARITIES OF THE SCANNING TUNNELING MICROSCOPY PROBE ON POROUS GALLIUM PHOSPHIDE;155
16.1;INTRODUCTION;155
16.2;EXPERIMENTAL;156
16.3;RESULTS AND DISCUSSIONS;156
16.4;STM Tip Shape Effect;157
16.5;“Error Budget” of the Tip Shape Effect;159
16.6;Lateral Effect;160
16.7;Tip Bending;162
16.8;Image Processing;166
16.9;CONCLUSIONS;168
16.10;Acknowledgments;168
16.11;REFERENCES;168
16.12;APPENDIX;169
17;INFLUENCE OF DOPING CONCENTRATION ON THE ETCHING RATE OF GaAs STUDIED BY ATOMIC FORCE MICROSCOPY;170
17.1;INTRODUCTION;170
17.2;METHODS;171
17.3;Acknowledgment;174
17.4;REFERENCES;174
18;COMPARATIVE SCANNING TUNNELING MICROSCOPY STUDIES OF CoFe2O4 NANOPARTICLES OF FERROFLUIDS IN ACIDIC MEDIUM;175
18.1;INTRODUCTION;175
18.2;MATERIALS AND METHODS;176
18.3;EXPERIMENTAL RESULTS;176
18.4;DISCUSSION;178
18.5;REFERENCES;179
19;FROM LABORATORY MEASUREMENTS TO THE FIRST IN-SITU ANALYSIS OF PRISTINE COMETARY GRAINS;180
19.1;INTRODUCTION;181
19.2;TECHNICAL DESCRIPTION OF MIDAS;182
19.3;Capabilities of the Microscope;182
19.4;The Collection and Transport System;183
19.5;Microvibration;183
19.6;AFM Measurements;184
19.7;Cosmic Spherules;184
19.8;OBSERVATIONS;185
19.9;DISCUSSION;185
19.10;Acknowledgment;187
19.11;REFERENCES;187
20;SYNTHESIS OF PREBIOTIC PEPTIDES AND OLIGONUCLEOTIDES ON CLAY MINERAL SURFACES: A SCANNING FORCE MICROSCOPY STUDY;188
20.1;INTRODUCTION;188
20.2;MATERIALS AND METHODS;189
20.3;RESULTS AND DISCUSSION;190
20.4;CONCLUSIONS;193
20.5;Acknowledgments;194
20.6;REFERENCES;194
21;SURFACE STRUCTURE AND INTERCALATIVE POLYMERIZATION STUDIES OF SMECTITE CLAY THIN FILMS;196
21.1;INTRODUCTION;196
21.2;MATERIALS AND METHOD;197
21.3;RESULTS AND DISCUSSION;197
21.4;CONCLUSION;201
21.5;Acknowledgments;202
21.6;REFERENCES;202
22;ATOMIC FORCE MICROSCOPY - A NEW AND COMPLEMENTARY TOOL IN ASPHALT RESEARCH COMPARED TO SCANNING ELECTRON MICROSCOPY;203
22.1;INTRODUCTION;203
22.2;REFERENCES;206
23;Index;207

Leseproben

APPLICATIONS OF SCANNING PROBE MICROSCOPY IN MATERIALS SCIENCE: EXAMPLES OF SURFACE MODIFICATION AND QUANTITATIVE ANALYSIS (p. 11-12)

Peter von Blanckenhagen
Forschungszentrum Karlsruhe
Institut für Nanotechnologie
Postfach 3640, D-76021
Karlsruhe, Germany

Abstract. An overview is presented of some applications of scanning tunneling and scanning force microscopy, which indicate capabilities to research and development in nanotechnology. Results are reported of studies of surface modifications by local material deposition (A1, Au) and by mechanical material removal (Au), and of studies of surface selfdiffusion (Au), cluster dynamics (Au), thermal stability of semiconducting quantum dots (In5A15Ga), metallic multilayers (Fe/Mo), nanocrystalline materials (Au), Al-island formation on Si (1 1 1) surfaces and, finally, of cluster size distribution as well as distance dependence of tip-sample interactions for A12O3 and Fe2O3 clusters.

INTRODUCTION

In recent years, scanning probe microscopy (SPM) has become an important tool in materials science. It not only allows ultimate analyses of surface structures to be conducted, but also unique procedures to be performed, such as material deposition, initiation of chemical reactions (e.g. oxidation, lithographic reactions), mechanical structuring as well as manipulation of atoms, molecules, and clusters.1,2 Phenomena of practical importance, such as friction,3,4 adhesion5, local magnetism,6,7and surface diffusion8 can be studied on a microscopic scale. Several special types of instruments are now available for surface modification and for studying the surface properties of materials.9,10,11 Among other methods of interest in materials science are electrolytic SPM techniques,12 and SPM techniques using magnetic13 and optical14 sensors.

Descriptions of surface topography were the main objective of earlier studies of scanning probe microscopy. In the past few years, however, more and more quantitative analyses have been performed by means of scanning probe microscopes.

In this overview, results will be discussed of nine cases of surface modification and quantitative analysis by scanning tunneling (STM) and scanning force microscopes (SFM, AFM). SPM has a considerable impact now on research and development in micro- and nanotechnology. Scanning force microscopes have become important tools for controlling the topography of electronic chips in the production process, and for analysis of the topography of micromechanical components. One of the most promising applications of scanning probe microscopy is in the elucidation of the fundamentals of future nanotechnology. In nanotechnology, materials science and solid state physics on an atomic scale should meet. Also studies of chemical and biological nanosystems will contribute to the fundamentals of future nanotechnology. Two aspects are of special interest: Firstly, the self-organization processes occurring in nature and secondly, the creation of nanosystems by surface modification and by manipulation of atoms, molecules or clusters, and the characterization of such artificial systems. It is worthwhile studying biological molecular systems, such as motors, sieves, and electrical conductors, to find ways of designing nanosystems for practical use. A review is presented below of the findings made in various subjects of potential interest in nanotechnology, which were studied at our laboratory over the past few years by scanning tunneling and scanning force microscopy.

MATERIALS AND METHODS

Local material deposition was performed with the UHV-STM supplied by Perkin-Elmer, which is operated by a Nanoscope III controller. The silicon surfaces were cleaned by flashing samples to 1250° C by direct current heating. The tunneling tips were produced by mechanical cutting in air of Au or A1 wires 0.25 mm thick. The materials used for SFM studies in air must be stable in air. In most cases, Au samples were used for exploratory studies to minimize the influence of the atmosphere. The samples were examined under a commercial atomic force microscope (Multimode SPM with Nanoscope IIIA controller) in the contact mode or the tapping mode of operation. In some cases, the chemical composition of surfaces was analyzed by Auger electron spectroscopy (AES).