An Introduction to TEM, SEM, and AEM
Buch, Englisch, 202 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 1060 g
ISBN: 978-0-387-25800-3
Verlag: Springer
Scanning and stationary-beam electron microscopes have become an indespensible tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and current practice of electron microscopy, aimed primarily at undergraduates who need to learn how the basic principles of physics are applied in an important area of science and technology that has contributed greatly to our knowledge of life processes and "inner space." However, it will be equally valuable for technologists who make use of electron microscopes and for graduate students, university teachers and researchers who need a concise text that deals with the basic principles of microscopy. Less technical but broader in scope than other microscopy textbooks, Physical Principles of Electron Microscopy is appropriate for undergraduates and technologists with limited mathematical training.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Technische Wissenschaften Sonstige Technologien | Angewandte Technik Angewandte Optik
- Naturwissenschaften Biowissenschaften Biowissenschaften
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffprüfung
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
- Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
- Naturwissenschaften Physik Quantenphysik
- Technische Wissenschaften Technik Allgemein Nanotechnologie
- Naturwissenschaften Physik Elektromagnetismus Elektrizität, Elektrodynamik
- Naturwissenschaften Physik Elektromagnetismus Quantenoptik, Nichtlineare Optik, Laserphysik
- Naturwissenschaften Physik Elektromagnetismus Optik
Weitere Infos & Material
An Introduction to Microscopy.- Electron Optics.- The Transmission Electron Microscope.- TEM Specimens and Images.- The Scanning Electron Microscope.- Analytical Electron Microscopy.- Recent Developments.
