Buch, Englisch, Band 29, 402 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 633 g
Theory of STM and Related Scanning Probe Methods
Buch, Englisch, Band 29, 402 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 633 g
Reihe: Springer Series in Surface Sciences
ISBN: 978-3-540-60824-0
Verlag: Springer Berlin Heidelberg
In this second edition the text has been updated and new methods are discussed.
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1. Introduction.- 1.1 Theoretical Concepts for Scanning Tunneling Microscopy.- 1.2 Theoretical Concepts for Force Microscopy.- References.- 2. STM Imaging of Single-Atom Adsorbates on Metals.- 2.1 Tunneling Hamiltonian Approach.- 2.2 Adsorbates on Metal Surfaces.- 2.3 Close Approach of the Tip: The Strong-Coupling Regime.- References.- 3. The Scattering Theoretical Approach to the Scanning Tunneling Microscope.- 3.1 The Theoretical Formalism.- 3.2 Tunneling Through Thick Organic Layers.- 3.3 Scanning Tunneling Microscopy at Metal Surface.- 3.4 Summary and Conclusions.- References.- 4. Spectroscopic Information in Scanning Tunneling Microscopy.- 4.1 Green’s Function Method.- 4.2 Derivation of the Transfer Hamiltonian Approach.- 4.3 One-Dimensional Models.- 4.4 Three-Dimensional Models.- 4.5 Conclusion.- References.- 5. The Role of Tip Atomic and Electronic Structure in Scanning Tunneling Microscopy and Spectroscopy.- 5.1 Background.- 5.2 Formalism of Theoretical Simulation of STM/STS.- 5.3 Simulation of STM/STS of the Graphite Surface.- 5.4 STM/STS of Si(100) Reconstructed Surfaces.- 5.5 The Negative-Differential Resistance Observed on the Si(111)$$
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$$-B Surface.- 5.6 The STM Image of the Si(111)$$
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$$-Ag Surface and the Effect of the Tip.- 5.7 Light Emission from a Scanning Tunneling Microscope.- 5.8 Summary and Future Problems.- Note Added in Proof.- References.- 6. Bohm Trajectories and the Tunneling Time Problem.- 6.1 Background.- 6.2 A Brief Discussion of Previous Approaches.- 6.4 Application to Simple Systems.- 6.5 Discussion.- References.- Additional References with Titles.- 7. Unified Perturbation Theory for STM and SFM.- 7.1 Background.- 7.2 The Modified Bardeen Approach.- 7.3 ExplicitExpressions for Tunneling Matrix Elements.- 7.4 Theoretical STM Images.- 7.5 Effect of Atomic Forces in STM Imaging.- 7.6 In-Situ Characterization of Tip Electronic Structure.- 7.7 Summary.- 7.8 Appendix: Modified Bardeen Integral for the Hydrogen Molecular Ion.- References.- 8. Theory of Tip—Sample Interactions.- 8.1 Tip—Sample Interaction.- 8.2 Long-Range (Van der Waals) Forces.- 8.3 Interaction Energy: Adhesion.- 8.4 Short-Range Forces.- 8.5 Deformations.- 8.6 Atom Transfer.- 8.7 Tip—Induced Modifications of Electronic Structure.- 8.8 Calculation of Current at Small Separation.- 8.9 Constriction Effect.- 8.10 Transition from Tunneling to Ballistic Transport.- 8.11 Tip Force and Conductivity.- 8.12 Summary.- References.- 9. Consequences of Tip—Sample Interactions.- 9.1 Methodology.- 9.2 Case Studies.- References.- 10. Theory of Contact Force Microscopy on Elastic Media.- 10.1 Description of a Scanning Force Microscope.- 10.2 Elastic Properties of Surfaces.- 10.3 Interaction Between SFM and Elastic Media.- 10.4 Conclusions and Outlook.- References.- 11. Theory of Atomic-Scale Friction.- 11.1 Microscopic Origins of Friction.- 11.2 Ideal Friction Machines.- 11.3 Predictive Calculations of the Friction Force.- 11.4 Limits of Non-destructive Tip—Substrate Interactions in Scanning Force Microscopy.- References.- 12. Theory of Non-contact Force Microscopy.- 12.1 Methodical Outline.- 12.2 Van der Waals Forces.- 12.3 Ionic Forces.- 12.4 Squeezing of Individual Molecules: Solvation Forces.- 12.5 Capillary Forces.- 12.6 Conclusions.- References.- 13. Recent Developments.- 13.1 STM Imaging of Single-Atom Adsorbates on Metals.- 13.2 The Scattering Theoretical Approach to Scanning Tunneling Microscopy and Scanning Tunneling Spectroscopy.- 13.3 Theory of Atom TransferBetween the Tip and the Surface.- 13.4 Böhm Trajectories and Tunneling—Time Problem.- 13.5 Non-Contact Force Microscopy.- References.- of Scanning Tunneling Microscopy I (Springer Series in Surface Sciences, Vol. 20).- of Scanning Tunneling Microscopy II (Springer Series in Surface Sciences, Vol. 28).