Kreis / Jüptner | An External Interface for Processing 3-D Holographic and X-Ray Images | Buch | 978-3-540-50822-9 | sack.de

Buch, Englisch, Band 1, 147 Seiten, Format (B × H): 170 mm x 244 mm, Gewicht: 289 g

Reihe: Research Reports Esprit

Kreis / Jüptner

An External Interface for Processing 3-D Holographic and X-Ray Images


Softcover Nachdruck of the original 1. Auflage 1989
ISBN: 978-3-540-50822-9
Verlag: Springer Berlin Heidelberg

Buch, Englisch, Band 1, 147 Seiten, Format (B × H): 170 mm x 244 mm, Gewicht: 289 g

Reihe: Research Reports Esprit

ISBN: 978-3-540-50822-9
Verlag: Springer Berlin Heidelberg


Internationally recognized experts in the field of holographic interferometric testing, X-ray testing, and structural analysis by finite element techniques have come together in ESPRIT project 898 to develop a system that integrates these techniques. This system acts as an external interface between the complementary nondestructive testing methods and computer based structural analysis. In the book the testing and analysis techniques are presented and compared with special emphasis on problems regarding their combination and integration. The architecture and the components of the interface system are described. Experiments proving the feasibility and applicability of the concepts are presented. The chapters of the book dealing with the different techniques are written by the individual partners of the project. A common test object is investigated by all techniques. The book helps the customer to select the testing and analysis method most suitable for his problem. It also presents the background for building up integrated testing equipment for analysis and control.

Kreis / Jüptner An External Interface for Processing 3-D Holographic and X-Ray Images jetzt bestellen!

Zielgruppe


Research

Weitere Infos & Material


1 Introduction.- 1.1 General objectives of ESPRIT project 898.- 1.2 Size and extent of ESPRIT project 898.- 1.3 Roles of the partners of ESPRIT project 898.- 2 Aim of ESPRIT project 898.- 2.1 Holographic interferometry and X-ray radiography: complementary methods.- 2.2 Combined holographic interferometry and X-ray radiography.- 2.3 Architecture of the external interface system.- 3 Deformation measurement by holographic interferometry.- 3.1 Theoretical foundations of holographic interferometry.- 3.2 Structures to be tested holographically.- 3.3 Loading of the structures.- 3.4 Quantitative evaluation of holographic interference patterns.- 3.5 Techniques of quantitative holographic interferometry.- 3.6 Evaluation of holographic interference patterns by the phase step method.- 3.7 Evaluation of holographic interference patterns by the Fourier-transform method.- 3.8 References.- 4 Structural and stress analysis.- 4.1 Analysis methods.- 4.2 The Finite Element program MELINA.- 4.3 Interpolation of holographic data.- 4.4 Software for interpolation and verification.- 4.5 Data formaf for representation of holographic images.- 4.6 Preparation for analysis.- 4.7 Analysis of honeycomb panel.- 5 Component inspection by X-ray radiography.- 5.1 Introduction to X-ray radiography.- 5.2 X-ray inspection system hardware.- 5.3 X-ray inspection system software.- 5.4 Summary.- 5.5 Appendix: Tabulated results of conformity tests.- 6 Microfocus X-ray testing.- 6.1 Theory of microfocus system.- 6.2 The automatic non-destructive testing system description.- 6.3 The microprocessor controlled microfocus.- 6.4 Operation.- 6.5 Technical description of the manipulator.- 6.6 Test of the system.- 6.7 Conclusion.- 7 Conclusions and future prospects.



Ihre Fragen, Wünsche oder Anmerkungen
Vorname*
Nachname*
Ihre E-Mail-Adresse*
Kundennr.
Ihre Nachricht*
Lediglich mit * gekennzeichnete Felder sind Pflichtfelder.
Wenn Sie die im Kontaktformular eingegebenen Daten durch Klick auf den nachfolgenden Button übersenden, erklären Sie sich damit einverstanden, dass wir Ihr Angaben für die Beantwortung Ihrer Anfrage verwenden. Selbstverständlich werden Ihre Daten vertraulich behandelt und nicht an Dritte weitergegeben. Sie können der Verwendung Ihrer Daten jederzeit widersprechen. Das Datenhandling bei Sack Fachmedien erklären wir Ihnen in unserer Datenschutzerklärung.