Sonstiges, Englisch, 226 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g
Sonstiges, Englisch, 226 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g
ISBN: 978-3-908452-24-9
Verlag: Trans Tech Publications
The main focus of this special topic volume is the development and possibilities of the MACRO language within TOPAS, with a specific session dedicated to WPPM. The collection is presented here in the form of a ?macro tutorial? for the benefit of the entire powder diffraction community. More than a collection of standard scientific papers, the contributions to this special issue provide methods, tutorials and practical suggestions and solutions for the proper use of TOPAS and WPPM in a number of applications; ranging from the most common to the most refined and specific cases.
Autoren/Hrsg.
Weitere Infos & Material
Advanced Input Files & Parametric Quantitative Analysis Using TopasProblem Solving with the TOPAS Macro Language: Corrections and Constraints in Simulated Annealing and Rietveld RefinementRobust Refinement as Implemented in TOPAS
In Situ Diffraction Studies: Thermal Decomposition of a Natural Plumbojarosite and the Development of Rietveld-Based Data Analysis TechniquesMolecular Motion by Refinement of TLS Matrices from High Resolution Laboratory Powder Diffraction Data: Implementation in the Program TOPAS and Application to Crystalline NaphthaleneSimulated Annealing Approach for Global Minimum Verification in Modeling of Pressure-Volume Dependence by Equations of State Obtained by High-Pressure DiffractionDirect Access to the Order Parameter: Parameterized Symmetry Modes and Rigid Body Movements as a Function of Temperature?Powder 3D Parametric?- A program for Automated Sequential and Parametric Rietveld Refinement Using TopasMEM Calculations on Apatites Containing Peroxide Using BAYMEM and TOPASProtein Powder Diffraction Analysis with TOPASComposition-Induced Microstrain Broadening: From Pattern Decomposition to whole Powder Pattern Modelling ProceduresWPPM: Microstructural Analysis beyond the Rietveld MethodWPPM: Advances in the Modeling of Dislocation Line BroadeningDomain Size Analysis in the Rietveld MethodThe Application of the Fundamental Parameters Approach as Implemented in TOPAS to Divergent Beam Powder Diffraction Data
