Slaev / Chunovkina / Mironovsky Metrology and Theory of Measurement

1. Auflage 2013
ISBN: 978-3-11-028482-9
Verlag: De Gruyter
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 581 Seiten

Reihe: ISSN

The De Gruyter Studies in Mathematical Physics are devoted to the publication of monographs and high-level texts in mathematical physics. They cover topics and methods in fields of current interest, with an emphasis on didactical presentation. The series will enable readers to understand, apply and develop further, with sufficient rigor, mathematical methods to given problems in physics. For this reason, works with a few authors are preferred over edited volumes. The works in this series are aimed at advanced students and researchers in mathematical and theoretical physics. They can also serve as secondary reading for lectures and seminars at advanced levels.

Autoren/Hrsg.

Slaev, Valery A.

Chunovkina, Anna G.

Mironovsky, Leonid A.

Fachgebiete

• Technische Wissenschaften Technik Allgemein Mess- und Automatisierungstechnik
• Interdisziplinäres Wissenschaften Wissenschaften: Forschung und Information Forschungsmethodik, Wissenschaftliche Ausstattung
• Mathematik | Informatik Mathematik Numerik und Wissenschaftliches Rechnen Angewandte Mathematik, Mathematische Modelle
• Technische Wissenschaften Energietechnik | Elektrotechnik Elektrotechnische Normen
• Technische Wissenschaften Bauingenieurwesen Normen (Bauingenieurwesen)
• Naturwissenschaften Physik Angewandte Physik

Inhaltsverzeichnis

Foreword
Introduction
1 International measurement system
2 Systems of reproducing physical quantities units and transferring their sizes (RUTS)
3 Potential measurement accuracy
4 Algorithms for evaluating the result of three measurements
5 Metrological traceability of measurement results
6 Validation of software used in metrology
Conclusion
Appendix
Bibliography
Index

Über Autor(innen)

Valery A. Slaev, Mendeleyev Research Institute for Metrology, Saint Petersburg, Russia; Anna G. Chunovkina, D.I. Mendeleyev Research Institute for Metrology (VNIIM), Saint Petersburg, Russia; Leonid A. Mironovsky, Saint Petersburg State University of Aerospace Instrumentation, Russia.