Practical Guide to Materials Characterization

Techniques and Applications
1. Auflage 2022
ISBN: 978-3-527-35071-1
Verlag: WILEY-VCH

Buch, Englisch, 224 Seiten, Format (B × H): 170 mm x 244 mm, Gewicht: 680 g

Practical Guide to Materials Characterization

Practice-oriented resource providing a hands-on overview of the most relevant materials characterization techniques in chemistry, physics, engineering, and more

Practical Guide to Materials Characterization focuses on the most widely used experimental approaches for structural, morphological, and spectroscopic characterization of materials, providing background, insights on the correct usage of the respective techniques, and the interpretation of the results. With a focus on practical applications, the work illustrates what to use and when, including real-life examples showing which characterization techniques are best suited for particular purposes. Furthermore, the work covers the practical elements of the analytical techniques used to characterize a wide range of functional materials (both in bulk as well as thin film form) in a simple but thorough manner.

To aid in reader comprehension, Practical Guide to Materials Characterization is divided into eight distinct chapters. To set the stage, the first chapter of the book reviews the fundamentals of materials characterization that are necessary to understand and use the methods presented in the ensuing chapters. Among the techniques covered are X-ray diffraction, Raman spectroscopy, X-ray spectroscopy, electron microscopies, magnetic measurement techniques, infrared spectroscopy, and dielectric measurements.

Specific sample topics covered in the remaining seven chapters include: - Bragg’s Law, the Von Laue Treatment, Laue’s Equation, the Rotating Crystal Method, the Powder Method, orientation of single crystals, and structure of polycrystalline aggregates

- Classical theory of Raman scattering, quantum theory of Raman spectroscopy, high-pressure Raman spectroscopy, and surface enhanced Raman spectroscopy

- Basic principles of XAS, energy referencing, XPS spectra and its features, Auger Electron Spectroscopy (AES), and interaction of electrons with matter

- Magnetization measuring instruments, the SQUID magnetometer, and the advantages and disadvantages of vibrating sample magnetometer (VSM)

With comprehensive and in-depth coverage of the subject, Practical Guide to Materials Characterization is a key resource for practicing professionals who wish to better understand key concepts in the field and seamlessly harness them in a myriad of applications across many different industries.

Autoren/Hrsg.

Sultan, Khalid

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffprüfung
• Naturwissenschaften Chemie Analytische Chemie Massenspektrometrie, Spektroskopie, Spektrochemie
• Naturwissenschaften Physik Thermodynamik Festkörperphysik, Kondensierte Materie

Inhaltsverzeichnis

BASICS OF MATERIAL CHARACTERIZATION TECHNIQUES
Introduction
Electromagnetic Spectrum
Fundamentals of Crystallography
Molecular Vibrations
Magnetism in Solids
Optical Properties of Solids
 
X-RAY DIFFRACTION
Introduction
Bragg's Law
Von Laue Treatment: Laue's Equation
Experimental Techniques
Geometry and Instrumentation
Stadard X-Ray Diffraction Pattern
Applications
Examples and Illustrations
 
RAMAN SPECTROSCOPY
Introduction
Infrared and Raman Spectroscopy
Raman Spectra: Origin
Classical Theory of Raman Scattering
Quantum Theory of Raman Spectroscopy
Raman Spectrometer
Resonance Raman Spectroscopy
Special Techniques
Applications and Illustrations
 
X-RAY SPECTROSCOPIC TECHNIQUES
X-Ray Absorption Spectroscopy (XAS)
X-Ray Photoelectron Spectroscopy (XPS)
Auger Electron Spectroscopy (AES)
 
MAGNETIC MEASUREMENTS
Introduction
Magnetization Measuring Instruments
Advantages and Disadvantage of Vibrating Sample Magnetometer (VSM)
Susceptibility Measurement
Examples and Illustrations
 
DIELECTRIC MEASUREMENTS
Introduction
Polarization and Dielectric Constant
Mechanism for Colossal Dielectric Response
Frequency Dependence of Polarizability
Classification of Dielectric Materials
Dielectric Dispersion: A Brief Discussion
Dielectric Loss and Relaxation
Complex Permittivity
Polarization Build Up
Jonscher's Universal Law
Examples and Illustrations
 
ELECTRON MICROSCOPY
Introduction
Generation of Electron Beam
Interaction of Electron Beam with Sample
Inelastic Scattering and Absorption
The Family of Electron Microscopes
Atomic Force Microscopy
Examples and Illustrations
 
INFRARED SPECTROSCOPY
Introduction
Instrumentation for FTIR
Fourier Transform
Electromagnetic Radiation
Infrared Absorption
Normal Modes of Vibration
Complicating Factors
Applications of IR Spectroscopy
 

Über Autor(innen)

Khalid Sultan is Assistant Professor in the Department of Physics of the Central University of Kashmir. His research interests are the rare earth transition metal oxide systems, characterized by electric, transport, dielectric, magnetic and X-ray measurements as well as by a variety of microscopy and spectroscopy techniques. Dr. Sultan has international collaborations with the Pohang Accelerator Lab and the Advanced Analysis Center of the Korea Institute of Technology.