Watt | The Principles and Practice of Electron Microscopy | Buch | 978-0-521-43456-0 | sack.de

Buch, Englisch, 496 Seiten, Format (B × H): 189 mm x 246 mm, Gewicht: 1340 g

Watt

The Principles and Practice of Electron Microscopy


2. Auflage 1997
ISBN: 978-0-521-43456-0
Verlag: Cambridge University Press

Buch, Englisch, 496 Seiten, Format (B × H): 189 mm x 246 mm, Gewicht: 1340 g

ISBN: 978-0-521-43456-0
Verlag: Cambridge University Press


The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological scientists. This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practising electron microscopists. The coverage has been brought completely up to date, whilst retaining descriptions of early classic techniques. Currently live topics such as computer control of microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, and high resolution scanning and transmission microscopy are all described. The highly praised case studies of the first edition have been expanded to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.

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Autoren/Hrsg.


Weitere Infos & Material


1. Microscopy with light and electrons; 2. Electron/specimen interactions: processes and detectors; 3. The electron microscope family; 4. Specimen preparation for electron microscopy; 5. The interpretation and analysis of micrographs; 6. Analysis in the electron microscope; 7. Specialised techniques in EM, and other microscopical and analytical techniques; 8. Examples of the use of electron microscopy; Appendix 1. Production and measurement of high vacua; Appendix 2. Vacuum deposition of thin metallic and carbon films for electron microscopy; Appendix 3. X-ray spectrometry; Appendix 4. Electron sources for electron microscopes; Bibliography; Additional literature; Names and addresses of electron microscope manufacturers and their agents; Index.



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