Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers
1. Auflage 2010
ISBN: 978-0-12-381317-6
Verlag: Elsevier Science & Techn.
Format: EPUB
Kopierschutz: 6 - ePub Watermark

E-Book, Englisch, 299 Seiten

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians

Autoren/Hrsg.

Inhaltsverzeichnis

1;Font Cover;1
2;Advances in Imaging and Electron Physics;4
3;Copyright Page;5
4;Contents;6
5;Preface;8
6;Contributors;10
7;Future Contributions;12
8;Chapter 1: Energy Filtered X-Ray Photoemission Electron Microscopy;16
8.1;1. Introduction;17
8.2;2. History;18
8.2.1;2.1. Early Development;18
8.2.2;2.2. Development After 1980;19
8.2.3;2.3. EXPEEM;20
8.3;3. Principle and Experimental Setup of PEEM and EXPEEM;21
8.3.1;3.1. Photoemission and Light Source;21
8.3.2;3.2. PEEM and EXPEEM Optic;28
8.3.3;3.3. Energy Analyzer for PEEM;30
8.4;4. Chemical Application of EXPEEM;47
8.4.1;4.1. In Situ Observation of Surface Reactions;47
8.4.2;4.2. PEEM Application to Soft Material Surfaces;51
8.5;5. Summary and Future Prospects;52
8.6;References;53
9;Chapter 2: Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy;60
9.1;1. Introduction;61
9.2;2. Three-Dimensional Electron Microscopy;62
9.2.1;2.1. Electron Tomography;62
9.2.2;2.2. Optical Depth Sectioning;63
9.2.3;2.3. Scanning Confocal Microscopy;71
9.3;3. Coherent Imaging in SCEM;76
9.3.1;3.1. Image Formation for a Weak Scatterer;76
9.3.2;3.2. Contrast Transfer;77
9.3.3;3.3. Bright-Field Imaging;79
9.4;4. Partially Coherent Imaging in SCEM;81
9.4.1;4.1. Inelastic Scattering Formulation;81
9.4.2;4.2. Depth Discrimination for Individual Impurities;83
9.5;5. Conclusions;86
9.6;Acknowledgments;87
9.7;References;87
10;Chapter 3: New Dimensions for Field Emission: Effects of Structure in the Emitting Surface;92
10.1;1. Introduction;93
10.1.1;1.1. Assumptions and Notation;96
10.2;2. Behavior in Constant Potential;97
10.2.1;2.1. Two Slits with Electrons of Constant Speed: "Young’s Slits with Electrons";97
10.2.2;2.2. Point Source with Uniform Potential;101
10.3;3. Behavior in Constant Field;103
10.3.1;3.1. Notation;103
10.3.2;3.2. Transversely Uniform Emission;104
10.3.3;3.3. Two Slits with Accelerated Electrons;107
10.3.4;3.4. Point Source with Accelerated Electrons;114
10.3.5;3.5. Ring Source with Accelerated Electrons;117
10.4;4. Summary of Results for Intensity;121
10.5;5. Behavior in Realistic Geometry;124
10.6;6. Interference Patterns;127
10.7;7. Electron-Optical Brightness;129
10.8;8. Discussion;129
10.9;9. Conclusions;132
10.10;Appendices;133
10.11;Acknowledgments;141
10.12;References;141
11;Chapter 4: Conductivity Imaging and Generalized Radon Transform: A Review;144
11.1;1. Introduction;145
11.2;2. The Reconstruction Process in EIT;147
11.2.1;2.1. Data-Fitting Methods;147
11.2.2;2.2. Sensitivity Methods;153
11.2.3;2.3. Backprojection Reconstruction Method;156
11.2.4;2.4. Other Reconstruction Approaches;164
11.3;3. Research Issues and Key Problem Areas of EIT;165
11.3.1;3.1. Three-Dimensionality;165
11.3.2;3.2. Ill-posedness, Sensitivity Considerations and Possible Sources of Error;166
11.3.3;3.3. Spatial Resolution Considerations;168
11.3.4;3.4. Anisotropy;169
11.3.5;3.5. Difference Imaging;169
11.3.6;3.6. Multifrequency Measurements;170
11.4;4. Application Areas of EIT;170
11.5;5. Conclusions and Future Research;173
11.6;Appendices;174
11.7;Definitions;174
11.8;Rules of Calculation;175
11.9;Acknowledgments;176
11.10;References;176
12;Chapter 5: Comparison of Color Demosaicing Methods;188
12.1;1. Introduction;189
12.2;2. Color Demosaicing;190
12.2.1;2.1. Introduction to Demosaicing;190
12.2.2;2.2. Basic Schemes and Demosaicing Rules;203
12.3;3. Demosaicing Schemes;213
12.3.1;3.1. Edge-Adaptive Demosaicing Methods;213
12.3.2;3.2. Estimated Color Correction;230
12.3.3;3.3. Demosaicing Using the Frequency Domain;236
12.3.4;3.4. Summary;242
12.4;4. Objective Evaluation Criteria for Demosaiced Images;242
12.4.1;4.1. Introduction;242
12.4.2;4.2. Demosaicing Artifacts;243
12.4.3;4.3. Classical Objective Criteria;247
12.4.4;4.4. Artifact-Sensitive Measurements;252
12.4.5;4.5. Measurements Dedicated to Low-Level Image Analysis;257
12.4.6;4.6. Summary;261
12.5;5. Quality Evaluation Results;261
12.5.1;5.1. Results of Classical Criteria;261
12.5.2;5.2. Results of Artifact-Sensitive Measurements;267
12.5.3;5.3. Discussion;269
12.5.4;5.4. Experimental Results for Edge Detection;272
12.6;6. Conclusion;276
12.7;References;277
13;Contents of Volumes 151–161;282
14;Index;286
15;Color Plates;292