E-Book, Englisch, Band 1, 488 Seiten, E-Book
E-Book, Englisch, Band 1, 488 Seiten, E-Book
Reihe: Wiley Series in Probability and Statistics
ISBN: 978-1-118-15045-0
Verlag: John Wiley & Sons
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)
This volume presents both theoretical and applied aspects of runsand scans, and illustrates their important role in reliabilityanalysis through various applications from science and engineering.Runs and Scans with Applications presents new and exciting contentin a systematic and cohesive way in a single comprehensive volume,complete with relevant approximations and explanations of somelimit theorems.
The authors provide detailed discussions of both classical andcurrent problems, such as:
* Sooner and later waiting time
* Consecutive systems
* Start-up demonstration testing in life-testing experiments
* Learning and memory models
* "Match" in genetic codes
Runs and Scans with Applications offers broad coverage of thesubject in the context of reliability and life-testing settings andserves as an authoritative reference for students and professionalsalike.
Autoren/Hrsg.
Weitere Infos & Material
List of Tables.
List of Figures.
Preface.
Introduction and Historical Remarks.
Waiting for the First Run Occurrence.
Applications.
Waiting for Multiple Run Occurrences.
Number of Run Occurrences.
Sooner/Later Run Occurrences.
Multivariate Run-Related Distributions.
Applications.
Waiting for the First Scan.
Waiting for Multiple Scans.
Number of Scan Occurrences.
Applications.
Bibliography.
Author Index.
Subject Index.