Brandon / Kaplan Microstructural Characterization of Materials

2. Auflage 2013
ISBN: 978-1-118-68148-0
Verlag: John Wiley & Sons
Format: EPUB
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 552 Seiten, E-Book

Microstructural characterization is usually achieved by allowingsome form of probe to interact with a carefully prepared specimen.The most commonly used probes are visible light, X-ray radiation, ahigh-energy electron beam, or a sharp, flexible needle. These fourtypes of probe form the basis for optical microscopy, X-raydiffraction, electron microscopy, and scanning probemicroscopy.
Microstructural Characterization of Materials, 2nd Editionis an introduction to the expertise involved in assessing themicrostructure of engineering materials and to the experimentalmethods used for this purpose. Similar to the first edition, this2nd edition explores the methodology of materials characterizationunder the three headings of crystal structure, microstructuralmorphology, and microanalysis. The principal methods ofcharacterization, including diffraction analysis, opticalmicroscopy, electron microscopy, and chemical microanalyticaltechniques are treated both qualitatively and quantitatively. Anadditional chapter has been added to the new edition to coversurface probe microscopy, and there are new sections on digitalimage recording and analysis, orientation imaging microscopy,focused ion-beam instruments, atom-probe microscopy, and 3-D imagereconstruction. As well as being fully updated, this second editionalso includes revised and expanded examples and exercises, with asolutions manual available athttp://develop.wiley.co.uk/microstructural2e/
Microstructural Characterization of Materials, 2nd Editionwill appeal to senior undergraduate and graduate students ofmaterial science, materials engineering, and materials chemistry,as well as to qualified engineers and more advanced researchers,who will find the book a useful and comprehensive generalreference source.

Autoren/Hrsg.

Brandon, David G.

Brandon, David

Kaplan, Wayne D.

Inhaltsverzeichnis

Preface to the Second Edition.
Preface to the First Edition.
1. The Concept of Microstructure.
1.1. Microstructural Features.
1.2. Crystallography and Crystal Structure.
2. Diffraction Analysis of Crystal Structure.
2.1. Scattering of Radiation by Crystals.
2.2. Reciprocal Space.
2.3. X-ray Diffraction Methods.
2.4. Diffraction Analysis.
2.5. Electron Diffraction.
3. Optical Microscopy.
3.1. Geometrical Optics.
3.2. Construction of the Microscope.
3.3. Specimen Preparation.
3.4. Image contrast.
3.5. Working with Digital Images.
3.6. Resolution, contrast and Image Interpretation.
4. Transmission Electron Microscopy.
4.1. Basic Principles.
4.2. Specimen Preparation.
4.3. The Origin of Contrast.
4.4. Kinematic Interpretation of Diffraction Contrast.
4.5. Dynamic Diffraction and Absorption effects.
4.6. Lattice Imaging at High Resolution.
4.7. Scanning Transmission Electron Microscopy.
5. Scanning Electron Microscopy.
5.1. Components of The Scanning electron Microscope.
5.2. Electron Beam-Specimen Interactions.
5.3. Electron Excitation of X-Rays.
5.4. Backscattered Electrons.
5.5. Secondary Electron Emission.
5.6. Alternative Imaging Modes.
5.7. Specimen Preparation and Topology.
5.8. Focused Ion Beam Microscopy.
6. Microanalysis in Electron Microscopy.
6.1. X-Ray Microanalysis.
6.2. Electron Energy Loss Spectroscopy.
7. Scanning Probe Microscopy and Related Techniques.
7.1. Surface Forces and Surface Morphology.
7.2. Scanning Probe Microscopes.
7.3. Field-Ion Microscopy and Atom Probe tomography.
8. Chemical Analysis of Surface Composition.
8.1. X-ray Photoelectron Spectroscopy.
8.2. Auger Electron Spectroscopy.
8.3. Secondary-Ion Mass Spectrometry.
9. Quantitative and Tomographic Analysis ofMicrostructure.
9.1. Basic Stereological Concepts.
9.2. Accessible and Inaccessible Parameters.
9.3. Optimizing Accuracy.
9.4. Automated Image Analysis.
9.5. Tomography and Three-Dimensional Reconstruction.
Appendices.
Index.