Cernik / Delhez / Mittemeijer European Powder Diffraction 4

Erscheinungsjahr 1996
ISBN: 978-3-0357-0511-9
Verlag: Trans Tech Publications
Format: PDF
Kopierschutz: 0 - No protection

E-Book, Englisch, 988 Seiten

This comprehensive publication presents most recent results, and covers practically all aspects of powder diffraction. Part 1 contains contributions dealing with powder diffraction methods, and the larger second part comprises contributions which deal with the application of powder-diffraction methods to specific problems in the physics and chemistry of solids.

Autoren/Hrsg.

Cernik, Robert J.

Delhez, R.

Mittemeijer, Eric Jan

Inhaltsverzeichnis

Preface
Structure Determination from Very Small Crystals
Analysis of Strain Fields by Means of Diffraction-Line Broadening
Application of the Smooth Genetic Algorithm for Indexing Powder Patterns – Tests for the Orthorhombic System
A Criterion for Correct Indexing of Powder Diffraction Diagrams Based on Preferred Orientation (Texture)
Rietveld Refinement Using Debye-Scherrer Film Techniques
Integration of Intensity and Angle Calibration into Rietveld Refinement
Ab Initio Calculations of Diffraction Patterns of Submicron Powders
Addition Method in the Quantitative Analysis: Dependence of Error on the Quantity of Additive
DOP-FIT Method for Quantitative Analysis of Multicomponent Powders
Quantitative X-Ray Phase Analysis of Materials with Disordered Structures
A New Possibility for Powder Diffraction: The Characterization of the Domain Microstructure in a Ferroelectric Material
X-Ray and Neutron Analysis of the Dislocation Content in Plastically Deformed ß-Brass
The Cross Correlation Method: A Useful Tool for Peak Shift Determination in XSE
Empirical Texture Correction for Different Diffraction Geometrics: Experimental Tests
New Opportunities in the Texture and Stress Field by the Whole Pattern Analysis
Analysis of Peak Shapes in X-Ray Diffractometry (GUINIER Geometry) of Standard Materials Using Asymmetric Profile Functions
Diffraction Anomalous Fine Structure Analysis on (Bi,Pb)2PtO4 Powders
Rapid Polymer Identification with X-Ray Diffraction
An Improved X-Ray Image Plate Detector for Diffractometry
Refinement of Powder Diffraction Data Collected Using Imaging Plates
X-Ray Imaging Using Fluorescence or Polycrystalline Diffraction
Stress Analysis Using an Area Detector
A Fully Automated High-Temperature Powder Diffractometer
A New High-Temperature Camera
A Low-Temperature Option Down to -70° C for a High-Temperature Attachment
In-Situ Time Resolved Synchrotron Powder Diffraction Studies of Syntheses and Chemical Reactions
Assessment of an In-Situ Reactor Cell: Temperature Calibration and Reliability of Diffracted Intensity
Profile Smoothing and Differentation with Reciprocal Polynomials
How to Solve the Problems for the Indexation of Complex Materials Using Laboratory Powder Diffraction: Application to Metal Phosphonates
Application of the Rietveld Method to XRD Patterns of Thin Films Recorded in Parallel Beam Geometry
Application of a New Rietveld Software for Quantitative Phase Analysis and Lattice Parameter Determination of AIN-SiC-Ceramics
An Interactive Windows Program for Profile Fitting and Size/Strain Analysis
Strain Scanning Using X-Rays and Neutrons
Resonant Powder X-Ray Diffraction
The Breadth and Shape of Instrumental Line Profiles for the Powder Diffraction Station 2.3 at the Daresbury Laboratory SRS
A New White Beam Powder Diffraction Facility at the Daresbury Laboratory Synchrotron Radiation Source
The High Resolution Powder Diffraction Beam Line at ESRF
D2AM: A CRG Beamline at ESRF for Material Science Studies
Through-Thickness Strain Scanning Using Synchrotron Radiation
Structure Refinement with Synchrtron Data: R-Factors, Errors and Significance Tests
A Dynamic Study of the Formation of Gas Clathrate Hydrates: In-Situ Synchrotron X-Ray Diffraction and Differential Scanning Calorimetry
Neutron Powder Diffractometer at the Budapest Research Reactor
ROT/DIFF: A Versatile Neutron Powder Time-of-Flight Diffractometer of Wide d-Spacing Coverage
Neutron Diffraction Pole-Figure Measurements Using a Pulsed White Beam and the Linear Julios-Detector
Equipment for Residual Stress Measurements with the High Resolution Fourier Diffractometer: Present Status and Prospects
High-Resolution Neutron Powder Diffractometry on Samples of Small Dimensions
High-Tc Superconductor Studies by Means of High-Resolution and High-Intensity Neutron Powder Diffraction at the IBR-2 Pulsed Reactor
Magnetic Structures in Cubis Laves Phase
Applications of a Thin Film Diffractometer
Structure Parameter Determination of Thin Films by Intensity Fitting in GIABD-Geometry
Analysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray Diffraction
The Crystal Structure and Texture Analyses of Polycrystalline Thin Film Sample Using Multiple Diffraction Datasets Obtained by Asymmetric Diffraction Technique
An Analysis of the Influence of Crystallographic Texture on Residual Stress Estimation for Metallic Films and Coatings
Residual Stress in Ti(C,N) Coatings on HSS Substrate
Dynamic Studies from Laboratory X-Rays
The Thermal Decomposition of CeM'2(NO3)6 (M' = K, NH4, Rb) Studied by Temperature-Dependent X-Ray Powder Diffraction
X-Ray Characterization of Complex Oxide Catalysts under Preparation and Reaction Conditions: Catalysts for Methanol Synthesis
Hydrotalcite Thermal Decomposition Mechanism: In Situ Study by XRD, AWAXS and EXAFS of a Layered Catalyst Precursor
Time- and Temperature Resolved X-Ray Powder Diffraction: In Situ Observation of the Ammonolysis Reaction of NH4TaF6
Temperature Resolved X-Ray Diffraction of Ammonium Nitrate Evaluated with Rietveld Analysis
Dynamic Observation of Crystallographic and Micro Structural Changes Associated with the Collapse and Recrystallisation of Cd Exchanged Zeolite-A
The Dehydration Process in the Natural Zeolite Laumontite: A Real-Time Synchrotron X-Ray Powder Diffraction Study
A Kinetic of the B1-B2 Phase Transition of Rubidium Iodide as a Function of Pressure
High-Pressure Behaviour of Titanium Dioxide
GIXD (Grazing Incidence X-Ray Diffraction) as a Tool for the In Situ Investigation of Electrochemical Reactions of Metals in Electrolyte Solutions: The Lead Electrode in 5 M Sulphuric Acid
Magnetostriction Studied with Precise High Temperature Powder Diffraction
High Temperature X-Ray Diffraction Studies on the Crystallization of Amorphous Fe-Zr-B Alloys
Real Time SAXS/WAXS/DTA Measurements of the Crystalline/Amorphous Transition of Low Molecular Weight Hydrogenated Polybutadiene
Crystallization of Gel-Processed PZT Powders
Kinetics of the Formation of PLZT: An In-Situ XRD Study
A General Method for the Analysis of Non-Isothermal Kinetic Data
European Standardization of XRPD Measurements
Powder Diffraction Simulation in the CAD of Multicomponenet Systems
The Effect of Impurities on X-Ray Compton Scattering in Belite
Study of the Growth of Thin Expitaxial CVD Diamond Films on Silicon
Residual Stress in Diamond Coatings by Synchrotron Radiation XRD
Grain Size Analysis in Electrodeposited Cu-Coatings
On the Thickness-Dependence of Textures in Electrodeposited Copper-Coatings
Variation of Preferred Orientation of Erbium Thin Films with Temperature and Substrate
Microstructure Formation in Electrodeposition of Highly Supersaturated Cu-Pb and Ag-Pb Layers
Residual Stress in Plasma-Sprayed Ceramic Coatings
X-Ray Diffraction Microstructural Characterization of PZT (Pb(ZrxTi1-x)O3 and Pt Thin Films on TiN/Ti/BPSG/Si Structures
Characterization of a New Phase in WO3 Thin Films Grown by Sol-Gel Method
Structure Analysis of Annealed Polycrystalline Ag/NiFe Multilayers
X-Ray Reflectivity and Diffuse Scattering Study of Thermally Treated W1-xSix/Si Multilayers
Characterization of N