Dallet / Machado da Silva Dynamic Characterisation of Analogue-to-Digital Converters

1. Auflage 2006
ISBN: 978-0-387-25903-1
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, Band 860, 280 Seiten, eBook

Reihe: The Springer International Series in Engineering and Computer Science

The Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for system’s performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architecture and characteristics for each end application, and on the other hand, to understand how they affect performance bottlenecks in the signal processing chain.Dynamic Characterisation of Analogue-to-Digital Converters presents a state of the art overview of the methods and procedures employed for characterising ADCs’ dynamic performance behaviour using sinusoidal stimuli. The three classical methods – histogram, sine wave fitting, and spectral analysis – are thoroughly described, and new approaches are proposed to circumvent some of their limitations. This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the most important and critical details for their implementation.

Zielgruppe

Professional/practitioner

Autoren/Hrsg.

Dallet, Dominique

Machado da Silva, José

Inhaltsverzeichnis

ADC Characterisation Based on Sinewave Analysis.- ADC Applications, Architectures and Terminology.- Sinewave Test Setup.- Time-Domain Data Analysis.- Frequency-Domain Data Analysis.- Code Histogram Test.- Comparative Study of ADC Sinewave Test Methods.- Measurement of Additional Parameters.- Jitter Measurement.- Differential Gain and Phase Testing.- Step and Transient Response Measurement.- Hysteresis Measurement.

Über Autor(innen)

Dallet, Dominique  obtained his PhD degree in Electrical Engineering in 1995 from the University of Bordeaux 1, where he is currently a professor at the Electronic Engineering School of Bordeaux (ENSEIRB). His main research activities, carried-out at the IXL laboratory, focus on mixed-signal circuit design and testing, digital and analogue signal processing, and programmable devices’ applications. His interests include also digital design and its application in BIST structures for the characterization of embedded A/D converters, as well as, digital signal processing applied to nondestructive techniques based on time-frequency representation. Machado da Silva, José received the Licenciatura and PhD, both in Electrical and Computer Engineering from the Faculdade de Engenharia da Universidade do Porto (FEUP), Portugal, in 1984 and 1998, respectively. He is currently an Assistant Professor at FEUP and a project leader at Instituto de Engenharia de Sistemas e de Computadores (INESC-Porto), with teaching and research responsibilities on design and testing of electronic circuits. His research interests include analogue and mixed-signal design for testability, new testing methodologies, analogue and digital signal processing, and VLSI design.