Delhez / Mittemeijer European Powder Diffraction EPDIC 2

Erscheinungsjahr 1993
ISBN: 978-3-0357-0477-8
Verlag: Trans Tech Publications
Format: PDF
Kopierschutz: 0 - No protection

E-Book, Englisch, 1012 Seiten

The power of powder diffraction - the diffraction analysis of polycrystalline specimens - is shown again convincingly in these Proceedings of the Second European Powder Diffraction Conference EPDIC 2.

Autoren/Hrsg.

Delhez, R.

Mittemeijer, E.J.

Inhaltsverzeichnis

Preface
State-of-the Art Powder Diffraction Applications with Conventional Sealed-Tube X-Ray Sources
A Practice Oriented Way to Produce Diffraction Reference Cards Using Evaporite Minerals
Quantitative Phase Analysis by Using Whole Diffraction Profiles
Quantitative Phase Analysis of Si3N4 Ceramics using the Powder Diffraction Standard Data Base
A Method for the Determinantion of Weight Factors for Quantitative Phase Analysis using Dual Phase Starting Powders with Application to a / ß - Silicon Nitride
Quantitative Phase Analysis from X-Ray Powder Diffraction Data using two Stage Method
Application of the Rietveld Method to Phase Analysis of Multilayered Systems
Estimation of the Texture Correction in X-Ray Phase Analysis
Quantitative Phase Analysis of Texturised Materials
Fourier Methods for Separation of Size and Strain Broadening
Background and Bragg Scattering Component Separation in Powders via the XRD Technique
Rietveld Refinement employing X-Ray Data on CaWO4 from Different Powder Diffraction Geometries
Stress Measurements in Textured Materials
Interpretation of X-Ray Stress Measurements
X-Ray Analysis of Residual Stresses and Textures in Thin Coatings
Oblique-Texture Electron Diffraction in Powder Crystallography
Texture Investigation by Means of Model Functions
Estimation of the Texture Component Parameters in Cubic Metals
Application of the ADC Method for ODF Approximation in Cases of Low Crystal and Sample Symmetries
XRD Texture Investigations with the Employment of Location Sensitive Measuring Technique
New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction
Texture Analysis of Thin Films on Single Crystalline Substrates
X-Ray Diffraction Method for Monitoring of Texture Evolution in Layers
Texture Determination of PbZr0.53Ti0.47O3 Thin Films by XRD and BKDP
The Ab-Initio Determination of Crystal Structures from their Powder Diffraction Patterns using a Combination of Entropy Maximisation and Likelihood Ranking
Application of a Simulated Annealing Approach in Powder Crystal Structure Analysis
Determination of Molecular Crystal Structures from X-Ray Powder Diffraction Data
Ab Initio Determination of Molecular Crystal Structures using Powder Diffraction Data from a Laboratory X-Ray Source
Application of X-Ray Powder Diffraction for the Investigation of Polytype Structures in Metals and Alloys
Diffraction from Thin Layers
Glancing-Incidence X-Ray Analysis of Thin Films
Intermediate-Resolution Reciprocal-Space Mapper
Locally Resolved X-Ray Investigations by Means of X-Ray Optics
A New Apparatus for In-Situ X-Ray Diffraction
In Situ Study of Particle Growth
A High Pressure Study of Metallic Glasses using Energy-Dispersive Powder Diffraction
X-Ray Diffractometry at High Temperatures
On the use of CPS120 Data in Rietveld Analysis
An Unconventional Pile-up Correction
PC-Rietveld Plus, A Comprehensive Rietveld Analysis Package for PC
KET - A PC Package for Structure and Substructure Investigations
ZDS - A Computer Program for Analysis of X-Ray Powder Diffraction Patterns
Program for Simulation of Diffraction Pattern of Small Particles
ki7: A Program for the Simulation of Powder Patterns
MacDUST - A Powder Diffraction Package Developed for the ADONE High Resolution Diffraction Station
Lattice-Constants Database for Clay Minerals
Smoothing by Digital Filters and a New Peak Search Routine
If one does not have a Sample R