E-Book, Englisch, 880 Seiten
Delhez / Mittemeijer European Powder Diffraction EPDIC 7
Erscheinungsjahr 2001
ISBN: 978-3-0357-0564-5
Verlag: Trans Tech Publications
Format: PDF
Kopierschutz: 0 - No protection
E-Book, Englisch, 880 Seiten
ISBN: 978-3-0357-0564-5
Verlag: Trans Tech Publications
Format: PDF
Kopierschutz: 0 - No protection
Volume is indexed by Thomson Reuters CPCI-S (WoS).X-ray powder diffraction is a non-destructive technique widely applied for the characterisation of crystalline materials. The method has been traditionally used for phase identification, quantitative analysis and the determination of structure imperfections. In recent years, applications have been extended to new areas, such as the determination of crystal structures and the extraction of three-dimensional microstructural properties.
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Preface
X-Ray Scattering from Metallic Multilayers
Deconvolution by Example - Computational Test of Effective Algorithms
Deconvolution of X-Ray Diffraction Profiles Using Series Expansion: A Line-Broadening Study of Polycrystalline 9-YSZ
Powder Pattern Decomposition with the Aid of Preferred Orientation - Use of the Whole Debye-Scherrer Ring
Fundamental Parameters Versus Learnt Profiles Using the Rietveld Program BGMN
Structure Solution of Molecular Crystals from Powder Diffraction Data Using Genetic Algorithms: Opportunities in Academic and Industrial Research
Structure Determination by Powder Diffractometry: Internet Course
Structure Solution from Powder Diffraction Data by a Combined Global Optimization of Several Cost Functions: Problems and Perspectives
MEM-Based Structure-Refinement System REMEDY and its Applications
ESPOIR: A Program for Solving Structures by Monte Carlo Analysis of Powder Diffraction Data
Modelling of Atomic and Magnetic Structures from Powder Diffraction Data: Recent Developments of the RMCPOW Method
A Re-Interpretation of the Direct Methods Sum Function
The Limits to the Determination of Crystal Structure from Powder X-Ray Diffraction Data
Standardless Estimation of Lattice Constants Based on Fundamental-Parameters Method
Determination of the Thermal Expansion Coefficient of Small Samples and Powders by X-Ray Diffractometry up to about 300°C: Some Results on Metals and Rocks
Data Mining in the ICDD's Metals & Alloys Relational Database
PCSIWIN: A Windows-Based Index Program with Hanawalt, Fink and Alphabetic Search Capabilities for Use with the ICDD Powder Diffraction File (PDF)
WinMProf: Visual Rietveld Software
WinPLOTR: A Windows Tool for Powder Diffraction Pattern Analysis
Interlaboratory Comparison (Round Robin) of the Application of the Rietveld Method to Quantitative Phase Analysis by X-Ray and Neutron Diffraction
Line Profile Analysis in the Rietveld Method and Whole-Powder-Pattern Fitting
Calculation of Diffraction Line Profiles for Structures with Dislocations
Peak-Shape Analysis Using the General Debye Equation
Peculiarities of the X-Ray Powder Diffraction Patterns from FCC Crystals Containing a High Concentration of Random Deformation Stacking Faults
Structural Characteristics of Disordered Lamellar Structures: Interpretation of XRD and SAXS Patterns
Peak Shift Correction for Transparency in Classical XRD Residual Stress Methods
General Newly-Discovered Regularities of Structure Inhomogeneity in Textured Metal Materials
The Fullest Description of the Structure of Textured Metal Materials with Generalized Pole Figures: the Example of Rolled Zr Alloys
Modeling the Texture Development of Two-Phase Composites by Considering Intra-Crystalline Misorientation
Anisotropy of Secondary Extinction Coefficient in Textured Films
High Resolution X-Ray Diffraction Using Energy Resolving Detectors
High-Temperature Double-Crystal X-Ray Diffractometer for In-Situ Studies, the Hotbird
Software Package for Data Acquisition and Remote Control of the High-Temperature X-Ray Diffractometer, Hotbird
Comparison of Optical Elements for X-Ray Diffraction Analysis in Para-Focusing and Parallel Beam Geometries
Polycapillary Condensing Lens: Alignment Procedures and Optical Performances
X-Ray Powder Diffractometer with an Elliptic Focusing Göbel Mirror and Debye Scherrer Geometry
Experimental Study of the Resolution Function of a Texture Diffractometer
Improved Backloading for Better Results
The Commissioning of a High Count Rate Detector on Station 2.3 at the SRS
In-Situ Studies of X-Ray Diffraction Line Profiles from Strained Copper Foils
Automated Estimations of Asymmetric Linewidth Parameters for High-Resolution X-Ray & Neutron Powder Diffraction Data
Magnetic Structure Determination from Powder Diffraction Symmetry Analysis and Simulated Annealing
Hydrogen Positions in KCo-, CsCo-, CsNi-, and CsCu-Tutton Salt Compounds Determined by Neutron Powder Diffraction
The Concept of the New Structure Powder Diffractometer (SPODI) at the FRM-II in Garching
E9: The New High-Resolution Neutron Powder Diffractometer at the Berlin Neutron Scattering Center
Monte Carlo Simulation of the High-Intensity 2-Axis Neutron Diffractometer D20
Instrumental Resolution Function of the ESRF Powder Diffraction Beamline BM16
Temperature Resolved X-Ray Diffraction as a Tool for Studying the Recrystallization Process in Cold-Rolled Steels
Interaction of Metal Nanoparticle Surfaces with Gas Phase Studied by X-Ray Diffraction
Amorphous-to-Crystalline Transformation of Thin ITO Films Studied by In-Situ Grazing Incidence X-Ray Diffractometry
In Situ X-Ray Powder Diffraction: The Reactions of Pb(IV)-Fluoride with Ammonia and NH4F
Dynamic XRD Studies of Phase Stabilized Ammonium Nitrate during Temperature Cycling
In-Situ X-Ray and Neutron Diffraction Study of Ba2In2O5
Neutron Diffraction Direct Observation of the Decomposition Processes in a Bi:Pb:Sr:Ca:Cu=1.7:0.3:2.0:2.5:3.5 Nitrate Freeze Dried Powder
Phase Transitions on Dehydration of the Natural Zeolite Thomsonite
Formation of Nanocrystalline Re-Si Thin Film Composites
X-Ray Diffraction Line Broadening from Gold and Platinum Thin Films
Co/Si/W/Si Multilayers with Enhanced Thermal Stability for Soft X-Ray and UV Optics
Influence of Annealing on Structural Properties of Metallic Multilayers
Bulk and Surface Structure of Semifluorinated Polyesters
C60 - Polym