Egerton Electron Energy-Loss Spectroscopy in the Electron Microscope

Erscheinungsjahr 2012
ISBN: 978-1-4615-6887-2
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, eBook

Electron energy-loss spectroscopy (EELS or ELS) has been used to investi gate the physical properties of solids for over 40 years in a handful of laboratories distributed around the world. More recently, electron micro scopists have become interested in EELS as a method of chemical analysis with the potential for achieving very high sensitivity and spatial resolution, and there is a growing awareness of the fact that the loss spectrum can provide structural information from a thin specimen. In comparison with energy-dispersive x-ray spectroscopy, for example, EELS is a fairly demand ing technique, requiring for its full exploitation a knowledge of atomic and solid-state physics, electron optics, and electronics. In writing this book, I have tried to gather together relevant information from these various fields. Chapter 1 begins at an elementary level; readers with some experience in EELS will be familiar with the content of the first two sections. Chapter 2 deals with instrumentation and experimental technique, and should con tain material of interest to researchers who want to get the best performance out of commercial equipment as well as those who contemplate building their own spectrometer or electron-detection system. Chapter 3 outlines the theory used to interpret spectral features, while Chapter 4 gives procedures for numerical processing of the energy-loss spectrum. Chapter 5 contains examples of practical applications of EELS and a discussion of radiation damage, spatial resolution, and detection limits.

Zielgruppe

Research

Autoren/Hrsg.

Egerton, R.F.

Inhaltsverzeichnis

1. An Introduction to Electron Energy-Loss Spectroscopy.- 1.1 Interaction of Fast Electrons with a Solid.- 1.2. The Electron Energy-Loss Spectrum.- 1.3. The Development of Experimental Techniques.- 1.4. Comparison of Analytical Methods.- 1.5. Further Reading.- 2. Instrumentation for Energy-Loss Spectroscopy.- 2.1. Energy-Analyzing and Energy-Selecting Systems.- 2.2. The Magnetic-Prism Spectrometer.- 2.3. The Use of Prespectrometer Lenses.- 2.4. Recording the Energy-Loss Spectrum.- 2.5. Energy-Filtered Imaging.- 3. Electron Scattering Theory.- 3.1. Elastic Scattering.- 3.2. Inelastic Scattering.- 3.3. Excitation of Outer-Shell Electrons.- 3.4. Inner-Shell Excitation.- 3.5. The Spectral Background to Inner-Shell Edges.- 3.6. The Structure of Inner-Shell Edges.- 4. Quantitative Analysis of the Energy-Loss Spectrum.- 4.1. Removal of Plural Scattering from the Low-Loss Region.- 4.2. Kramers-Kronig Analysis.- 4.3. Removal of Plural Scattering from Inner-Shell Edges.- 4.4. Background Fitting to Ionization Edges.- 4.5. Elemental Analysis Using Inner-Shell Edges.- 4.6. Analysis of Extended Energy-Loss Fine Structure.- 5. Applications of Energy-Loss Spectroscopy.- 5.1. Measurement of Specimen Thickness.- 5.2. Low-Loss Spectroscopy.- 5.3. Core-Loss Microanalysis.- 5.4. Spatial Resolution and Elemental Detection Limits.- 5.5. Structural Information from EELS.- Appendix A. Relativistic Bethe Theory.- Appendix B. FORTRAN Programs.- B.3. Incident-Convergence Correction.- B.4. Fourier-Log Deconvolution.- B.5. Kramers-Kronig Transformation.- Appendix C. Plasmon Energies of Some Elements and Compounds.- Appendix D. Inner-Shell Binding Energies and Edge Shapes.- Appendix E. Electron Wavelengths and Relativistic Factors; Fundamental Constants.- References.