Egerton Electron Energy-Loss Spectroscopy in the Electron Microscope

2. Auflage 1996
ISBN: 978-1-4757-5099-7
Verlag: Springer US
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 485 Seiten, eBook

to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.

Zielgruppe

Research

Autoren/Hrsg.

Egerton, R.F.

Inhaltsverzeichnis

1. An Introduction to Electron Energy-Loss Spectroscopy.- 2. Instrumentation for Energy-Loss Spectroscopy.- 3. Electron Scattering Theory.- 4. Quantitative Analysis of the Energy-Loss Spectrum.- 5. Applications of Energy-Loss Spectroscopy.- Appendix A. Relativistic Bethe Theory.- Appendix B. Computer Programs.- B.1. Matrix Deconvolution.- B.2. Fourier-Log Deconvolution.- B.3. Kramers—Kronig Analysis and Thickness Determination.- B.4. Fourier-Ratio Deconvolution.- B.5. Incident-Convergence Correction.- B.9. Lenz Elastic and Inelastic Cross Sections.- B.10. Conversion between Oscillator Strength and Cross Section.- B.11. Conversion between Mean Energy and Inelastic Mean Free Path.- Appendix C. Plasmon Energies of Some Elements and Compounds.- Appendix D. Inner-Shell Energies and Edge Shapes.- Appendix E. Electron Wavelengths and Relativistic Factors; Fundamental Constants.- References.