Jenkins / Snyder Introduction to X-Ray Powder Diffractometry

1. Auflage 2012
ISBN: 978-1-118-52091-8
Verlag: John Wiley & Sons
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, Band 138, 432 Seiten, E-Book

Reihe: Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications

When bombarded with X-rays, solid materials produce distinctscattering patterns similar to fingerprints. X-ray powderdiffraction is a technique used to fingerprint solid samples, whichare then identified and cataloged for future use-much the way theFBI keeps fingerprints on file. The current database of some 70,000material prints has been put to a broad range of uses, from theanalysis of moon rocks to testing drugs for purity.
Introduction to X-ray Powder Diffractometry fully updates theachievements in the field over the past fifteen years and providesa much-needed explanation of the state-of-the-art techniquesinvolved in characterizing materials. It covers the latestinstruments and methods, with an emphasis on the fundamentals ofthe diffractometer, its components, alignment, calibration, andautomation.
The first three chapters outline diffraction theory in clearlanguage, accessible to both students and professionals inchemistry, physics, geology, and materials science. The book'smiddle chapters describe the instrumentation and procedures used inX-ray diffraction, including X-ray sources, X-ray detection, andproduction of monochromatic radiation. The chapter devoted toinstrument design and calibration is followed by an examination ofspecimen preparation methods, data collection, and reduction. Thefinal two chapters provide in-depth discussions of qualitative andquantitative analysis.
While the material is presented in an orderly progression,beginning with basic concepts and moving on to more complexmaterial, each chapter stands on its own and can be studiedindependently or used as a professional reference. More than 230illustrations and tables demonstrate techniques and clarify complexmaterial.
Self-contained, timely, and user-friendly, Introduction to X-rayPowder Diffractometry is an enormously useful text and professionalreference for analytical chemists, physicists, geologists andmaterials scientists, and upper-level undergraduate and graduatestudents in materials science and analytical chemistry.
X-ray powder diffraction-a technique that has matured significantlyin recent years-is used to identify solid samples and determinetheir composition by analyzing the so-called "fingerprints" theygenerate when X-rayed. This unique volume fulfills two major roles:it is the first textbook devoted solely to X-ray powderdiffractometry, and the first up-to-date treatment of the subjectin 20 years.
This timely, authoritative volume features:
* Clear, concise descriptions of both theory and practice-includingfundamentals of diffraction theory and all aspects of thediffractometer
* A treatment that reflects current trends toward automation,covering the newest instrumentation and automation techniques
* Coverage of all the most common applications, with specialemphasis on qualitative and quantitative analysis
* An accessible presentation appropriate for both students andprofessionals
* More than 230 tables and illustrations
Introduction to X-ray Powder Diffractometry, a collaborationbetween two internationally known and respected experts in thefield, provides invaluable guidance to anyone using X-ray powderdiffractometers and diffractometry in materials science, ceramics,the pharmaceutical industry, and elsewhere.

Autoren/Hrsg.

Jenkins, Ron

Snyder, Robert L.

Snyder, Robert

Inhaltsverzeichnis

Characteristics of X-Radiation.
The Crystalline State.
Diffraction Theory.
Sources for the Generation of X-Radiation.
Detectors and Detection Electronics.
Production of Monochromatic Radiation.
Instruments for the Measurement of Powder Patterns.
Alignment and Maintenance of Powder Diffractometers.
Specimen Preparation.
Acquisition of Diffraction Data.
Reduction of Data from Automated Powder Diffractometers.
Qualitative Analysis.
Quantitative Analysis.
Appendices.
Index.

Über Autor(innen)

Ron Jenkins is General Manager at the International Centre forDiffraction Data in Newtown Square, Pennsylvania. He has beeninvolved in X-ray research for over thirty years and has receivedseveral professional awards. Dr. Jenkins is the author of X-rayFluorescence Spectrometry, An Introduction to X-ray Spectrometry,and six other books, as well as numerous papers and audio courses.He also wrote the section on X-ray technology in Kirk-OthmerEncyclo-pedia of Chemical Technology.
Robert L. Snyder is Professor of Ceramic Science at New York StateCollege of Ceramics at Alfred University, and Director of theuniversity's Institute for Ceramic Superconduc-tivity. A Fellow ofthe American Ceramic Society, Professor Snyder is the author of twoprevious books and more than 200 published papers. He is active innumerous professional organizations and speaks frequently atconferences.