Lüth | Solid Surfaces, Interfaces and Thin Films | Buch | 978-3-319-10755-4 | sack.de

Buch, Englisch, 589 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 11319 g

Reihe: Graduate Texts in Physics

Lüth

Solid Surfaces, Interfaces and Thin Films


6th Auflage 2015
ISBN: 978-3-319-10755-4
Verlag: Springer International Publishing

Buch, Englisch, 589 Seiten, Format (B × H): 160 mm x 241 mm, Gewicht: 11319 g

Reihe: Graduate Texts in Physics

ISBN: 978-3-319-10755-4
Verlag: Springer International Publishing


This book emphasises both experimental and theoretical aspects of surface, interface and thin-film physics. As in previous editions the preparation of surfaces and thin films, their atomic and morphological structure, their vibronic and electronic properties as well as fundamentals of adsorption are treated. Because of their importance in modern information technology and nanostructure research, particular emphasis is paid to electronic surface and interface states, semiconductor space charge layers and heterostructures. A special chapter of the book is devoted to collective phenomena at interfaces and in thin films such as superconductivity and magnetism. The latter topic includes the meanwhile important issues giant magnetoresistance and spin-transfer torque mechanism, both effects being of high interest in information technology. In this new edition, for the first time, the effect of spin-orbit coupling on surface states is treated. In this context the class of the recently detected topological insulators, materials of significant importance for spin electronics, are discussed. Particular emphasis, hereby, is laid on the new type of topologically protected surface states with well-defined spin orientation. Furthermore, some important well established experimental techniques such as X-ray diffraction (XRD) and reflection anisotropy spectroscopy (RAS), which were missing so far in earlier editions, were added in this new 6 edition of the book.

Lüth Solid Surfaces, Interfaces and Thin Films jetzt bestellen!

Zielgruppe


Graduate


Autoren/Hrsg.


Weitere Infos & Material


Surface and Interface Physics: Its Definition and Importance.- Preparation of Well-Defined Surfaces, Interfaces and Thin Films.- Morphology and Structure of Surfaces, Interfaces and Thin Films.- Scattering from Surfaces and Thin Films.- Surface Phonons.- Electronic Surface States.- Space-Charge Layers at Semiconductor Inferfaces.- Metal–Semiconductor Junctions and Semiconductor Heterostructures.- Collective Phenomena at Interfaces:Superconductivity and Ferromagnetism.- Adsorption on Solid Surfaces.


Hans Lüth was born in Aachen, Germany, in 1940. He received the diploma in physics in 1965 and the doctoral degree (PhD) in physics in 1968, both from the Aachen University of Technology (RWTH). Between 1974 and 1986 he held several guest scientist and visiting professor positions at the IBM Thomas J. Watson Research Centre (USA), the Universities of Paris (F), Aix-Marseille (F) and Modena (I). Since 1980 he has been professor for physics and since 2000 simultaneously professor for electrical engineering at the RWTH Aachen. Additionally, in 1988 he became the director of the Institute of Bio- and Nanosystems at the Research Centre Jülich, Germany. In 2006 and 2007 he was Research Director for Key Technologies at the Research Centre Jülich. For his scientific work and for his globally used text books he was awarded the Doctor Honoris Causa by the Universite de Haute-Alsace, Mulhouse-Colmar (F). His research interests center around semiconductor interface physics and quantum electronics.



Ihre Fragen, Wünsche oder Anmerkungen
Vorname*
Nachname*
Ihre E-Mail-Adresse*
Kundennr.
Ihre Nachricht*
Lediglich mit * gekennzeichnete Felder sind Pflichtfelder.
Wenn Sie die im Kontaktformular eingegebenen Daten durch Klick auf den nachfolgenden Button übersenden, erklären Sie sich damit einverstanden, dass wir Ihr Angaben für die Beantwortung Ihrer Anfrage verwenden. Selbstverständlich werden Ihre Daten vertraulich behandelt und nicht an Dritte weitergegeben. Sie können der Verwendung Ihrer Daten jederzeit widersprechen. Das Datenhandling bei Sack Fachmedien erklären wir Ihnen in unserer Datenschutzerklärung.