Buch, Englisch, 1004 Seiten, Format (B × H): 186 mm x 254 mm, Gewicht: 1823 g
Reihe: Practical Spectroscopy
Buch, Englisch, 1004 Seiten, Format (B × H): 186 mm x 254 mm, Gewicht: 1823 g
Reihe: Practical Spectroscopy
ISBN: 978-0-8247-0600-5
Verlag: Taylor & Francis Inc
"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
X-ray physics; wavelength-dispersive X-ray fluorescence; energy-dispersive x-ray flourescences; data analysis; quantification in XRF analysis of infinitely thick samples; quantification in XRF analysis of intermediate-thickness samples; radioisotope X-ray analysis; synchrotron radiation X-ray emission; total-reflection XRF; polarized beam XRF; capillary beam XRF or X-ray micro-flourescence; particle-induced X-ray emission; electron-induced X-ray emission; sample preparation for XRF.