VLSI Design and Test

22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
1. Auflage 2019
ISBN: 978-981-13-5949-1
Verlag: Springer Nature Singapore

Buch, Englisch, Band 892, 722 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 1101 g

Reihe: Communications in Computer and Information Science

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

Zielgruppe

Research

Autoren/Hrsg.

Rajaram, S.

Singh, Virendra

Balamurugan, N.B.

Gracia Nirmala Rani, D.

Fachgebiete

• Mathematik | Informatik EDV | Informatik Technische Informatik
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Schaltungsentwurf
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikroprozessoren

Inhaltsverzeichnis

Digital design.- Analog and mixed signal design.- Hardware security.- Micro bio-fluidics.- VLSI testing.- Analog circuits and devices.- Network-on-chip.- Memory.- Quantum computing and NoC.- Sensors and interfaces.