Buch, Englisch, Band 333, 132 Seiten, HC runder Rücken kaschiert, Format (B × H): 160 mm x 241 mm, Gewicht: 395 g
Reihe: NATO Science Series E:
Buch, Englisch, Band 333, 132 Seiten, HC runder Rücken kaschiert, Format (B × H): 160 mm x 241 mm, Gewicht: 395 g
Reihe: NATO Science Series E:
ISBN: 978-0-7923-4489-6
Verlag: Springer Netherlands
The keynote lectures were delivered by some of the world's best scientists in the field and some of the topics covered include: (1) The possible application of STM in atomically resolved chemical analysis. (2) The principles of scanning force/friction and scanning near-field optical microscopes. (3) The scanning photoemission electron microscopes built at ELETTRA and SRRC, with a description of synchrotron radiation microscopy. (4) Recent progress in the development of spatially-resolved photoelectron microscopy, especially the use of zone plate photon optics. (5) The present status of non-scanning photoemission microscopy with slow electrons. (6) the BESSY 2 project for a non-scanning photoelectron microscope with electron optics. (7) Spatially-resolved reaction studies of chemical waves and oscillatory phenomena with the UV photoemission microscope.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Verbundwerkstoffe
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffprüfung
- Naturwissenschaften Physik Thermodynamik Festkörperphysik, Kondensierte Materie
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Produktionstechnik Fertigungstechnik
- Naturwissenschaften Chemie Physikalische Chemie
- Naturwissenschaften Physik Physik Allgemein Experimentalphysik
- Naturwissenschaften Physik Thermodynamik Oberflächen- und Grenzflächenphysik, Dünne Schichten
Weitere Infos & Material
- Surface state electrons: transport through dangling bonds on Silicon, and scattering and confinement on metals.- - SFFM and SNOM of heterogeneous materials-.- - Synchrotron radiation spectromicroscopy: opportunities, limitations and data taking strategies.- - Scanning spectro-Microscopy with 250 to 800 eV X-rays-.- - Recent advances in LEEM/PEEM for structural and chemical analysis.- - Spectromicroscopy: some developments at BESSY.- - Shedding light on surface reactions PEEM, EMSI and RAM probed chemistry on solid surfaces.- - Subject Index.