Russ / Frs / Kiessling Fundamentals of Energy Dispersive X-Ray Analysis

Butterworths Monographs in Materials
1. Auflage 2013
ISBN: 978-1-4831-6400-7
Verlag: Elsevier Science & Techn.
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 314 Seiten, Web PDF

Fundamentals of Energy Dispersive X-ray Analysis provides an introduction to the fundamental principles of dispersive X-ray analysis. It presents descriptions, equations, and graphs to enable the users of these techniques to develop an intuitive and conceptual image of the physical processes involved in the generation and detection of X-rays. The book begins with a discussion of X-ray detection and measurement, which is accomplished by one of two types of X-ray spectrometer: energy dispersive or wavelength dispersive. The emphasis is on energy dispersive spectrometers, given their rather widespread use compared to the wavelength dispersive type. This is followed by separate chapters on techniques such as X-ray absorption; spectrum processing; and elimination of spectrum background produced by electron excitation. Subsequent chapters cover X-ray fluorescence; the use of regression models; hardware for X-ray fluorescence analysis; scattering, background, and trace element analysis; and methods for producing inner shell excitation of atoms in a sample of interest. The final chapter deals with applications of X-ray analysis.

Autoren/Hrsg.

Russ, John C.

Frs, M. Ashby

Kiessling, R.

Charles, J.

Inhaltsverzeichnis

1;Front Cover;1
2;Fundamentals of Energy Dispersive X-Ray Analysis;4
3;Copyright Page;5
4;Table of Contents;6
5;Chapter 1. X-Ray Emission;8
6;Chapter 2. Wavelength Dispersive Spectrometers;17
6.1;Bragg Diffraction;17
6.2;Spectrometer Mechanisms;18
6.3;Crystals;20
6.4;Proportional Counters;20
6.5;Summary of Characteristics;23
7;Chapter 3. Energy Dispersive Spectrometers;24
7.1;History;24
7.2;Principles of Operation;25
7.3;Preamplification;27
7.4;Pulse Processing;28
7.5;Counting Time Corrections;30
7.6;Resolution;34
7.7;Spectral Artefacts;35
7.8;Qualitative Analysis with ED Systems;44
8;Chapter 4. Electron Penetration in Solids;49
8.1;Electron Backscattering;56
9;Chapter 5. Monte-Carlo Modelling;64
9.1;Typical Results;67
9.2;The Problem with Monte-Carlo;74
10;Chapter 6. X-Ray Absorption;76
11;Chapter 7. Secondary Fluorescence;88
12;Chapter 8. Applying the Corrections(Quantitative Analysis);98
13;Chapter 9. Standards:Real, Complex and Imaginary;107
13.1;Compound Standards;110
13.2;Interpolating;111
13.3;Calculating Pure Intensities;113
13.4;Spectrometer Efficiency;117
13.5;Using Theoretical Intensities;120
13.6;No Standards at All;122
14;Chapter 10. Accuracy and Errors;124
14.1;Counting Statistics;125
14.2;Spectrum Processing;126
14.3;Correction Models;129
14.4;Standards;131
14.5;Conclusions;135
15;Chapter 11. Spectrum Processing;137
15.1;Smoothing;137
15.2;Background Removal;139
15.3;Computing the Background;140
15.4;Frequency Filtering;141
15.5;Digital Filters for Differentiation;143
15.6;Peak Deconvolution;145
15.7;Generating Peak Profiles;148
15.8;Calibration Shifts;152
15.9;Overlap Factors;155
16;Chapter 12. Background in Electron Excited Spectra;158
16.1;Other Considerations;164
16.2;Peak to Background Models;167
17;Chapter 13. Thin Sections in STEM and TEM;171
17.1;Peak to Background;171
17.2;Elemental Ratios;174
17.3;Standards;175
17.4;Other Considerations;178
18;Chapter 14. Ultra - Low Energies;181
18.1;"Windowless" ED detectors;181
18.2;Excitation of Low Z Elements;185
18.3;Data Interpretation;186
19;Chapter 15. X-ray Distribution Maps;188
19.1;Ratemeters;194
19.2;Problems with Surface Topography;197
20;Chapter 16. Heterogeneous Samples;199
21;Chapter 17. Less Common Methods;207
21.1;Handling Non-standard Situations;208
22;Chapter 18. X-ray Fluorescence - Fundamentals;215
22.1;Photon Excitation - X-ray Tubes;215
22.2;Absorption of the Generating X-rays;217
22.3;The Effective Wavelength Model;223
23;Chapter 19. Regression Models;227
23.1;Influence Coefficient Models;229
23.2;Other Forms and Models;231
23.3;Examples of Calibration Curves;234
24;Chapter 20. Hardware for XRF;236
24.1;Energy Dispersive XRF;238
24.2;Qualitative Analysis;239
25;Chapter 21. Sample Effects;244
25.1;Depth of Analysis;247
25.2;Analysis of layered structures;250
25.3;Filter Paper Samples;251
26;Chapter 22. Scattering, Background and Trace Element Analysis;254
26.1;Quantification at Low Levels;259
27;Chapter 23. Modifying the Excitation Function;266
27.1;Secondary Targets;266
27.2;Radioactive Sources;272
27.3;Filters;274
27.4;Polarized X-rays;279
28;Chapter 24. Other Ways to Excite the Sample;282
28.1;Proton Induced X-ray Emission (PIXE);282
28.2;Alpha Particle Excitation;285
29;Chapter 25. Sorting, Tagging, and Matching;288
29.1;Tagging;289
29.2;Alloy Sorting;292
29.3;Matching Stored Spectra;296
30;Chapter 26. Conclusions;298
30.1;Sample Preparation;299
31;References;302
32;Index;312