Atomic Force Microscopy for Energy Research

1. Auflage 2022
ISBN: 978-1-032-00407-5
Verlag: CRC Press

Buch, Englisch, 455 Seiten, Format (B × H): 161 mm x 240 mm, Gewicht: 848 g

Reihe: Emerging Materials and Technologies

Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials—such as lithium-ion batteries, solar cells, and other energy-related materials—are addressed.

FEATURES

- First book to focus on application of AFM for energy research

- Details the use of advanced AFM and addresses many types of functional AFM tools

- Enables readers to operate an AFM instrument successfully and to understand the data obtained

- Covers new achievements in AFM instruments, including electrochemical strain microscopy, and how AFM is being combined with other new methods such as infrared (IR) spectroscopy

With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics who are working with AFM or planning to use it in their own fields of research, especially energy research.

Zielgruppe

Academic

Autoren/Hrsg.

Shen, Cai

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde
• Technische Wissenschaften Energietechnik | Elektrotechnik Technologien für Fossile Energieträger
• Technische Wissenschaften Verfahrenstechnik | Chemieingenieurwesen | Biotechnologie Verfahrenstechnik, Chemieingenieurwesen
• Naturwissenschaften Physik Mechanik Energie
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Sensorik

Inhaltsverzeichnis

1. Principles and Basic Modes of Atomic Force Microscopy 2. Advanced Modes of Electrostatic and Kelvin Probe Force Microscopy for Energy Applications 3. Piezoresponse Force Microscopy and Electrochemical Strain Microscopy 4. Hybrid AFM Technique: Atomic Force Microscopy-Scanning Electrochemical Microscopy 5. Scanning Microwave Impedance Microscopy 6. Atomic Force Microscopy-Based Infrared Microscopy for Chemical Nano-Imaging and Spectroscopy 7. Application of AFM in Lithium Batteries Research 8. Application of AFM in Solar Cell Research 9. Application of AFM for Analyzing the Microstructure of Ferroelectric Polymer as an Energy Material 10. Application of AFM in Microbial Energy Systems 11. Practical Guidance of AFM Operations for Energy Research

Über Autor(innen)

Cai Shen received his Ph.D. in Chemistry from the University of St Andrews at UK in 2008. Sequentially, he continued his research at the University of Maryland, Heidelberg University and Aarhus University before he joined Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Science as an Associate Professor in 2013. He was promoted to Professor in 2021. He has published 100 papers in peer-reviewed journals. He is on the editorial boards for a number of international journals including Journal of Microscopy. His current research interests are lithium-ion batteries and applications of atomic force microscopy for the study of functional materials.