E-Book, Englisch, 368 Seiten, E-Book
Yablon Scanning Probe Microscopy for Industrial Applications
1. Auflage 2013
ISBN: 978-1-118-72304-3
Verlag: John Wiley & Sons
Format: EPUB
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)
Nanomechanical Characterization
E-Book, Englisch, 368 Seiten, E-Book
ISBN: 978-1-118-72304-3
Verlag: John Wiley & Sons
Format: EPUB
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)
Describes new state-of-the-science tools and theircontribution to industrial R&D
With contributions from leading international experts in thefield, this book explains how scanning probe microscopy is used inindustry, resulting in improved product formulation, enhancedprocesses, better quality control and assurance, and new businessopportunities. Readers will learn about the use of scanning probemicroscopy to support R&D efforts in the semiconductor,chemical, personal care product, biomaterial, pharmaceutical, andfood science industries, among others.
Scanning Probe Microscopy for Industrial Applicationsemphasizes nanomechanical characterization using scanning probemicroscopy. The first half of the book is dedicated to a generaloverview of nanomechanical characterization methods, offering acomplete practical tutorial for readers who are new to the topic.Several chapters include worked examples of useful calculationssuch as using Hertz mechanics with and without adhesion to model acontact, step-by-step instructions for simulations to guidecantilever selection for an experiment, and data analysisprocedures for dynamic contact experiments.
The second half of the book describes applications ofnanomechanical characterization in industry, including:
* New formulation development for pharmaceuticals
* Measurement of critical dimensions and thin dielectric films inthe semiconductor industry
* Effect of humidity and temperature on biomaterials
* Characterization of polymer blends to guide product formulationin the chemicals sector
* Unraveling links between food structure and function in thefood industry
Contributions are based on the authors' thorough review of thecurrent literature as well as their own firsthand experienceapplying scanning probe microscopy to solve industrial R&Dproblems.
By explaining the fundamentals before advancing to applications,Scanning Probe Microscopy for Industrial Applications offersa complete treatise that is accessible to both novices andprofessionals. All readers will discover how to apply scanningprobe microscopy to build and enhance their R&D efforts.
Autoren/Hrsg.
Weitere Infos & Material
Preface and Acknowledgements
Chapter 1 Overview of Atomic Force Microscopy
Chapter 2 Understanding the tip-sample contact: an overview of contact mechanics from the macro to the nanoscale
Chapter 3: understanding surface forces using static and dynamic approach/retraction curves
Chapter 4: Phase Imaging
Chapter 5: Dynamic contact AFM methods for nanomechanical properties
Chapter 6: Best Practices in AFM Imaging
Chapter 7: Nanoindentation measurements of Mechanical properties of very thin films and nanostructured materials at high spatial resolution
Chapter 8: SPM for Critical Measurements in the Semiconductor Industry
Chapter 9: SPM for Polymer Applications in the Chemicals Industry
Chapter 10: Unravelling links between food structure and function with probe microscopy
Chapter 11: Microcantilever Sensors For Petrochemical Applications
Chapter 12: Applications of SPM in cosmetic Science
Chapter 13: Applications of Scanning Probe Microscopy and Nanomechanical Analysis in Pharmaceutical Development
Chapter 14: A comparative nanomechanical study of multiharmonic force microscopy and nanoindentation on low dielectric constant materials
Chapter 15: Nanomechanical Characterization of Biomaterial Surfaces: polymer coatings that elute drugs