Chen / Ong / Neo Microwave Electronics

Measurement and Materials Characterization
1. Auflage 2004
ISBN: 978-0-470-02045-6
Verlag: John Wiley & Sons
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 552 Seiten, E-Book

The development of high speed, high frequency circuits and systemsrequires an understanding of the properties of materialsfunctioning at the microwave level. This comprehensive referencesets out to address this requirement by providing guidance on thedevelopment of suitable measurement methodologies tailored for avariety of materials and application systems. Bringing togethercoverage of a broad range of techniques in one publication for thefirst time, this book:
* Provides a comprehensive introduction to microwave theory andmicrowave measurement techniques.
* Examines every aspect of microwave material properties, circuitdesign and applications.
* Presents materials property characterisation methods along witha discussion of the underlying theory.
* Outlines the importance of microwave absorbers in the reductionin noise levels in microwave circuits and their importance withindefence industry applications.
* Relates each measurement technique to its application acrossthe fields of microwave engineering, high-speed electronics, remotesensing and the physical sciences.
This book will appeal to practising engineers and techniciansworking in the areas of RF, microwaves, communications, solid-statedevices and radar. Senior students, researchers in microwaveengineering and microelectronics and material scientists will alsofind this book a very useful reference.

Autoren/Hrsg.

Chen, L.-F.

Ong, C. K.

Neo, C. P.

Varadan, Vasundara V.

Varadan, V. V.

Varadan, Vijay K.

Inhaltsverzeichnis

Preface.
1. Electromagnetic Properties of Materials.
2. Microwave Theory and Techniques for MaterialsCharacterization.
3. Reflection Methods.
4. Transmission/Reflection Methods.
5. Resonator Methods.
6. Resonant-perturbation Methods.
7. Planar-circuit Methods.
8. Measurements of Permittivity and Permeability Tensors.
9. Measurement of Ferroelectric Materials.
10. Microwave Measurement of Chiral Materials.
11. Measurement of Microwave Electrical TransportProperties.
12. Measurement of Dieletric Properties of Materials atHigh Temperatures.
Index.