Smallman / Ashbee / Owen Modern Metallography

The Commonwealth and International Library: Metallurgy Division
1. Auflage 2013
ISBN: 978-1-4831-8094-6
Verlag: Elsevier Science & Techn.
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 224 Seiten, Web PDF

Modern Metallography focuses on the defects in the properties of metals, such as precipitates, cracks, grain boundaries, dislocations, stacking faults, and impurity atoms. The publication first offers information on reflected light microscopy and high temperature microscopy. Discussions focus on specimen preparation, defects of lenses, methods of increasing the resolving power of an objective, long working distance objectives, and typical hot-stage experiments. The text then elaborates on surface topography and polarizing microscope, including oblique illumination, interferometry, examination of anisotropic surfaces, and other uses of polarized light microscopy. The text takes a look at X-ray metallography and specialized X-ray diffraction techniques. Topics include Laue method and orientation, structure factor, powder method and the accurate measurement of lattice parameters, Bragg law, sheet textures, and preferred orientation. The publication further elaborates on electron microscopy and metallography at the atomic level. The manuscript is a valuable reference for students and readers interested in modern metallography.

After gaining his PhD in 1953, Professor Smallman spent five years at the Atomic Energy ResearchEstablishment at Harwell before returning to the University of Birmingham, where he became Professorof Physical Metallurgy in 1964 and Feeney Professor and Head of the Department of PhysicalMetallurgy and Science of Materials in 1969. He subsequently became Head of the amalgamatedDepartment of Metallurgy and Materials (1981), Dean of the Faculty of Science and Engineering, andthe first Dean of the newly created Engineering Faculty in 1985. For five years he wasVice-Principalof the University (1987-92).He has held visiting professorship appointments at the University of Stanford, Berkeley, Pennsylvania(USA), New SouthWales (Australia), Hong Kong and Cape Town, and has received HonoraryDoctorates from the University of Novi Sad (Yugoslavia), University ofWales and Cranfield University.His research work has been recognized by the award of the Sir George Beilby Gold Medal of theRoyal Institute of Chemistry and Institute of Metals (1969), the Rosenhain Medal of the Institute ofMetals for contributions to Physical Metallurgy (1972), the Platinum Medal, the premier medal ofthe Institute of Materials (1989), and the Acta Materialia Gold Medal (2004).Hewas elected a Fellowof the Royal Society (1986), a Fellowof the RoyalAcademy of Engineering(1990), a Foreign Associate of the United States National Academy of Engineering (2005), andappointed a Commander of the British Empire (CBE) in 1992. A former Council Member of theScience and Engineering Research Council, he has been Vice-President of the Institute of Materialsand President of the Federated European Materials Societies. Since retirement he has been academicconsultant for a number of institutions both in the UK and overseas.

Autoren/Hrsg.

Smallman, R. E.

Ashbee, K. H. G.

Owen, W. S.

Hopkins, D. W.

Finniston, H. M.

Inhaltsverzeichnis

1;Front Cover;1
2;Modern Metallography;4
3;Copyright Page;5
4;Table of Contents;6
5;PREFACE;10
6;CHAPTER 1. REFLECTED LIGHT MICROSCOPY;14
6.1;Introduction;14
6.2;Specimen preparation;14
6.3;The reflected light microscope;15
6.4;Defects of lenses;22
6.5;Methods of increasing the resolving power of an objective;26
6.6;Examples of the contrast observed with reflected light;27
6.7;Suggestions for further reading;31
7;CHAPTER 2. HIGH TEMPERATURE MICROSCOPY;32
7.1;Introduction;32
7.2;Long working distance objectives;33
7.3;Typical hot-stage experiments;36
7.4;Suggestions for further reading;41
8;CHAPTER 3. SURFACE TOPOGRAPHY;42
8.1;The importance of surface topography observations;42
8.2;Oblique illumination;44
8.3;Opaque stop and phase contrast;47
8.4;Interferometry;53
8.5;Examples of surface topography;59
8.6;Suggestions for further reading;65
9;CHAPTER 4. THE POLARIZING MICROSCOPE;66
9.1;Polarized light;66
9.2;Examination of anisotropic surfaces;69
9.3;Other uses of polarized light microscopy;72
9.4;Suggestions for further reading;74
10;CHAPTER 5. X-RAY METALLOGRAPHY;75
10.1;Introduction;75
10.2;White and characteristic radiation;75
10.3;The Laue conditions;76
10.4;The Bragg law;78
10.5;The structure factor;80
10.6;The Laue method and orientation determination;84
10.7;Powder method and the accurate measurement of lattice parameters;89
10.8;Appendix to Chapter V;94
10.9;The reciprocal lattice and the reflection sphere;94
10.10;Vector notation;97
10.11;Diffraction;98
10.12;Suggestions for further reading;101
11;CHAPTER 6. SPECIALIZED X-RAY DIFFRACTION TECHNIQUES;102
11.1;Introduction;102
11.2;Preferred orientation;102
11.3;Wire textures;103
11.4;Sheet textures;105
11.5;Small-angle X-ray scattering;112
11.6;Micro-probe analyser;113
11.7;The observation of dislocations by X-ray diffraction contrast;116
11.8;Suggestions for further reading;119
12;CHAPTER 7. ELECTRON MICROSCOPY — I ELECTRON MICROSCOPE;120
12.1;Electron wavelength;120
12.2;The electron microscope;121
12.3;The electron gun and condenser lens system;124
12.4;Specimen assembly;126
12.5;Lens defects;127
12.6;Control of focusing and magnification;128
12.7;Bright- and dark-field images;130
12.8;Selected area diffraction;132
12.9;Resolution;138
12.10;Recording the image;138
12.11;Microscope attachments;141
12.12;Preparation of specimens;143
12.13;Replica techniques;143
12.14;Thin metal foil techniques;144
12.15;Suggestions for further reading;148
13;CHAPTER 8. ELECTRON MICROSCOPY — II CONTRAST THEORY;149
13.1;Introduction;149
13.2;Diffraction of electrons by perfect crystals;150
13.3;Electron diffraction by an imperfect crystal;157
13.4;Suggestions for further reading;160
14;CHAPTER 9. ELECTRON MICROSCOPY — III INTERPRETATION;161
14.1;Introduction;161
14.2;Analysis of selected area diffraction patterns;161
14.3;Interpretation of additional features on S.A.D. patterns;167
14.4;Indexing crystallographic features on micrographs;173
14.5;Contrast from dislocations and the g.b analysis;176
14.6;Stacking fault contrast and the displacement vector;183
14.7;Measurement of the stacking fault energy;185
14.8;Nature of prismatic dislocation loops;191
14.9;Dislocation densities;197
14.10;Precipitation phenomena;198
14.11;Heating-stage experiments;205
14.12;Cooling-stage experiments;207
14.13;Suggestions for further reading;209
15;CHAPTER 10. METALLOGRAPHY AT THE ATOMIC LEVEL;210
15.1;Field-ion microscope;210
15.2;Applications;214
15.3;Neutron diffraction;215
15.4;Suggestions for further reading;221
16;INDEX;222