E-Book, Englisch, Band 28, 308 Seiten, eBook
Wiesendanger / Güntherodt Scanning Tunneling Microscopy II
Erscheinungsjahr 2012
ISBN: 978-3-642-97363-5
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark
Further Applications and Related Scanning Techniques
E-Book, Englisch, Band 28, 308 Seiten, eBook
Reihe: Springer Series in Surface Sciences
ISBN: 978-3-642-97363-5
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark
Scanning Tunneling Microscopy II, like its predecessor,
presents detailed and comprehensive accounts of the basic
principles and broad range of applications of STM and
related scanning probe techniques. The applications
discussed in this volume come predominantly from the fields
of electrochemistry and biology. In contrast to those
described in Vol. I, these sudies may be performed in air
and in liquids. The extensions of the basic technique to
map other interactions are described inchapters on scanning
force microscopy, magnetic force microscopy, scanning
near-field optical microscopy, together with a survey of
other related techniques. Also described here is the use of
a scanning proximal probe for surface modification.
Togehter, the two volumes give a comprehensive account of
experimental aspcets of STM. They provide essentialreading
and reference material for all students and researchers
involvedin this field.
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
1. Introduction.- 1.1 STM in Electrochemistry and Biology.- 1.2 Probing Small Forces on a Small Scale.- 1.3 Related Scanning Probe Microscopies.- 1.4 Nanotechnology.- References.- 2. STM in Electrochemistry.- 2.1 Principal Aspects.- 2.2 Experimental Concepts for Electrolytic STM at Potential-Controlled Electrodes.- 2.3 Electrochemical Applications of In Situ STM at Potential-Controlled Electrodes.- 2.4 Outlook.- References.- 3. The Scanning Tunneling Microscope in Biology.- 3.1 Instrumentation.- 3.2 Processing of STM Images.- 3.3 Preparation.- 3.4 Applications.- 3.5 Imaging and Conduction Mechanisms.- 3.6 Conclusions.- References.- 4. Scanning Force Microscopy (SFM).- 4.1 Experimental Aspects of Force Microscopy.- 4.2 Forces and Their Relevance to Force Microscopy.- 4.3 Microscopic Description of the Tip—Sample Contact.- 4.4 Imaging with the Force Microscope.- 4.5 Conclusions and Outlook.- References.- 5. Magnetic Force Microscopy (MFM).- 5.1 Basic Principles of MFM.- 5.2 Measurement Techniques.- 5.3 Force Sensors.- 5.4 Theory of MFM Response.- 5.5 Imaging Data Storage Media.- 5.6 Imaging Soft Magnetic Materials.- 5.7 Resolution.- 5.8 Separation of Magnetic and Topographic Signals.- 5.9 Comparison with Other Magnetic Imaging Techniques.- 5.10 Conclusions and Outlook.- References.- 6. Related Scanning Techniques.- 6.1 Historical Background.- 6.2 STM and Electrical Measurements.- 6.3 STM and Optical Effects.- 6.4 Near-Field Thermal Microscopy.- 6.5 Scanning Force Microscopy and Extensions.- 6.6 Conclusion.- References.- 7. Nano-optics and Scanning Near-Field Optical Microscopy.- 7.1 Nano-optics: Optics of Nanometer-Size Structures.- 7.2 Experimental Work.- 7.3 Plasmons and Spectroscopic Effects.- 7.4 Imaging by SNOM.- 7.5 Discussion, Outlook, Conclusions.- References.-8. Surface Modification with a Scanning Proximity Probe Microscope.- 8.1 Overview.- 8.2 Microfabrication with a Scanning Probe Microscope.- 8.3 Investigation of the Fabrication Process.- 8.4 Review of SXM Lithography.- References.
