Wiesendanger / Güntherodt Scanning Tunneling Microscopy III

Theory of STM and Related Scanning Probe Methods
Erscheinungsjahr 2012
ISBN: 978-3-642-97470-0
Verlag: Springer
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, Band 29, 375 Seiten, eBook

Reihe: Springer Series in Surface Sciences

While the first two volumes on Scanning Tunneling Microscopy (STM) and its related scanning probe (SXM) methods have mainly concentrated on intro ducing the experimental techniques, as well as their various applications in different research fields, this third volume is exclusively devoted to the theory of STM and related SXM methods. As the experimental techniques including the reproducibility of the experimental results have advanced, more and more theorists have become attracted to focus on issues related to STM and SXM. The increasing effort in the development of theoretical concepts for STM/SXM has led to considerable improvements in understanding the contrast mechanism as well as the experimental conditions necessary to obtain reliable data. Therefore, this third volume on STM/SXM is not written by theorists for theorists, but rather for every scientist who is not satisfied by just obtaining real space images of surface structures by STM/SXM. After a brief introduction (Chap. 1), N. D. Lang first concentrates on theoretical concepts developed for understanding the STM image contrast for single-atom adsorbates on metals (Chap. 2). A scattering-theoretical approach to the STM is described by G. Doyen (Chap. 3). In Chap. 4, C. NClguera concentrates on the spectroscopic information obtained by STM, whereas the role of the tip atomic and electronic structure in STM/STS is examined more closely by M. Tsukada et al. in Chap. 5.

Zielgruppe

Research

Autoren/Hrsg.

Wiesendanger, Roland

Güntherodt, Hans-Joachim

Inhaltsverzeichnis

1. Introduction.- 1.1 Theoretical Concepts for Scanning Tunneling Microscopy.- 1.2 Theoretical Concepts for Force Microscopy.- References.- 2. STM Imaging of Single-Atom Adsorbates on Metals.- 2.1 Tunneling Hamiltonian Approach.- 2.2 Adsorbates on Metal Surfaces.- 2.3 Close Approach of the Tip: The Strong-Coupling Regime.- References.- 3. The Scattering Theoretical Approach to the Scanning Tunneling Microscope.- 3.1 The Theoretical Formalism.- 3.2 Tunneling Through Thick Organic Layers.- 3.3 Scanning Tunneling Microscopy at Metal Surface.- 3.4 Summary and Conclusions.- References.- 4. Spectroscopic Information in Scanning Tunneling Microscopy.- 4.1 Green’s Function Method.- 4.2 Derivation of the Transfer Hamiltonian Approach.- 4.3 One-Dimensional Models.- 4.4 Three-Dimensional Models.- 4.5 Conclusion.- References.- 5. The Role of Tip Atomic and Electronic Structure in Scanning Tunneling Microscopy and Spectroscopy.- 5.1 Background.- 5.2 Formalism of Theoretical Simulation of STM/STS.- 5.3 Simulation of STM/STS of the Graphite Surface.- 5.4 STM/STS of Si(100) Reconstructed Surfaces.- 5.5 The Negative-Differential Resistance Observed on the $$
Si\left( {111} \right)\sqrt 3 \, \times \,\sqrt 3 - B
$$ Surface.- 5.6 The STM Image of the $$
Si\left( {111} \right)\sqrt 3 \, \times \,\sqrt 3 - Ag
$$ Surface and the Effect of the Tip.- 5.7 Light Emission from a Scanning Tunneling Microscope.- 5.8 Summary and Future Problems.- Note Added in Proof.- References.- 6. Bohm Trajectories and the Tunneling Time Problem.- 6.1 Background.- 6.2 A Brief Discussion of Previous Approaches.- 6.3 Bohm’s Trajectory Interpretation of Quantum Mechanics.- 6.4 Application to Simple Systems.- 6.5 Discussion.- References.- Additional References with Titles.- 7. Unified Perturbation Theory forSTM and SFM.- 7.1 Background.- 7.2 The Modified Bardeen Approach.- 7.3 Explicit Expressions for Tunneling Matrix Elements.- 7.4 Theoretical STM Images.- 7.5 Effect of Atomic Forces in STM Imaging.- 7.6 In-Situ Characterization of Tip Electronic Structure.- 7.7 Summary.- 7.8 Appendix: Modified Bardeen Integral for the Hydrogen Molecular Ion.- References.- 8. Theory of Tip—Sample Interactions.- 8.1 Tip—Sample Interaction.- 8.2 Long-Range (Van der Waals) Forces.- 8.3 Interaction Energy: Adhesion.- 8.4 Short-Range Forces.- 8.5 Deformations.- 8.6 Atom Transfer.- 8.7 Tip-Induced Modifications of Electronic Structure.- 8.8 Calculation of Current at Small Separation.- 8.9 Constriction Effect.- 8.10 Transition from Tunneling to Ballistic Transport.- 8.11 Tip Force and Conductivity.- 8.12 Summary.- References.- 9. Consequences of Tip—Sample Interactions.- 9.1 Methodology.- 9.2 Case Studies.- References.- 10. Theory of Contact Force Microscopy on Elastic Media.- 10.1 Description of a Scanning Force Microscope.- 10.2 Elastic Properties of Surfaces.- 10.3 Interaction Between SFM and Elastic Media.- 10.4 Conclusions and Outlook.- References.- 11. Theory of Atomic-Scale Friction.- 11.1 Microscopic Origins of Friction.- 11.2 Ideal Friction Machines.- 11.3 Predictive Calculations of the Friction Force.- 11.4 Limits of Non-destructive Tip—Substrate Interactions in Scanning Force Microscopy.- References.- 12. Theory of Non-contact Force Microscopy.- 12.1 Methodical Outline.- 12.2 Van der Waals Forces.- 12.3 Ionic Forces.- 12.4 Squeezing of Individual Molecules: Solvation Forces.- 12.5 Capillary Forces.- 12.6 Conclusions.- References.