Meeker / Escobar Statistical Methods for Reliability Data

1. Auflage 1998
ISBN: 978-0-471-67327-9
Verlag: John Wiley & Sons
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 712 Seiten, E-Book

Reihe: Wiley Series in Probability and Statistics

Amstat News asked three review editors to rate their topfive favorite books in the September 2003 issue. StatisticalMethods for Reliability Data was among those chosen.
Bringing statistical methods for reliability testing in linewith the computer age This volume presents state-of-the-art,computer-based statistical methods for reliability data analysisand test planning for industrial products. Statistical Methodsfor Reliability Data updates and improves establishedtechniques as it demonstrates how to apply the new graphical,numerical, or simulation-based methods to a broad range of modelsencountered in reliability data analysis. It includes methods forplanning reliability studies and analyzing degradation data,simulation methods used to complement large-sample asymptotictheory, general likelihood-based methods of handling arbitrarilycensored data and truncated data, and more. In this book, engineersand statisticians in industry and academia will find:
* A wealth of information and procedures developed to giveproducts a competitive edge
* Simple examples of data analysis computed with the S-PLUSsystem-for which a suite of functions and commands is availableover the Internet
* End-of-chapter, real-data exercise sets
* Hundreds of computer graphics illustrating data, results ofanalyses, and technical concepts
An essential resource for practitioners involved in productreliability and design decisions, Statistical Methods forReliability Data is also an excellent textbook for on-the-jobtraining courses, and for university courses on applied reliabilitydata analysis at the graduate level.
An Instructor's Manual presenting detailed solutions to all theproblems in the book is available upon requestfrom the Wileyeditorial department.

Autoren/Hrsg.

Meeker, William Q.

Escobar, Luis A.

Inhaltsverzeichnis

Partial table of contents:
Reliability Concepts and Reliability Data.
Nonparametric Estimation.
Other Parametric Distributions.
Probability Plotting.
Bootstrap Confidence Intervals.
Planning Life Tests.
Degradation Data, Models, and Data Analysis.
Introduction to the Use of Bayesian Methods for ReliabilityData.
Failure-Time Regression Analysis.
Accelerated Test Models.
Accelerated Life Tests.
Case Studies and Further Applications.
Epilogue.
Appendices.
References.
Indexes.

Über Autor(innen)

WILLIAM Q. MEEKER, PhD, is Professor of Statistics andDistinguished Professor of Liberal Arts and Sciences at Iowa StateUniversity. He is a Fellow of the American Statistical Associationand an elected member of the International Statistics Institute.Among his many awards and honors are the Youdan Prize and twoWilcoxon Prizes as well as two awards for outstanding teaching atIowa State. He is coauthor of Statistical Intervals: A Guide forPractitioners (Wiley) and of numerous book chapters andpublications in the engineering and statistical literature. Aformer editor of Technometrics and coeditor of Selected Tables inMathematical Statistics, he is currently Associate Editor forInternational Statistical Review.
LUIS A. ESCOBAR, PhD, is a Professor in the Department ofExperimental Statistics at Louisiana State University. His researchand consulting interests include statistical analysis ofreliability data, accelerated testing, survival analysis, andnonlinear models. An Associate Editor for Technometrics and the IIETransactions of Quality and Reliability Engineering, ProfessorEscobar is a Fellow of the American Statistical Association andelected member of the International Statistics Institute. He is theauthor of several book chapters, and his publications have appearedin the engineering and statistical literature.